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Antistatic testing system protecting circuit

A generation system and relay technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems such as test results that cannot meet the requirements

Inactive Publication Date: 2015-11-25
SHANGHAI RES INST OF MICROELECTRONICS SHRIME PEKING UNIV
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0005] Although the structure shown in this figure can test devices whose impedance is smaller than the impedance of the transmission line pulse test system, it is only suitable for environments with low discharge pulse voltages. For the test environment of high-voltage discharge pulses or large impedance devices, the figure The test results provided by the structure shown are far from meeting the requirements, so it is urgent to improve the structure’s ability to withstand high pulse discharge voltage and test large impedance devices

Method used

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Embodiment Construction

[0019] In the existing TLP transmission line pulse test system, the reflected wave caused by the impedance mismatch has a great influence on the test result, resulting in deviation of the data result. Adding a Schottky diode at the end of the transmission line can only be used to weaken the negative reflection wave, which has no effect on the forward reflection wave generated by the device under test whose impedance is greater than the characteristic impedance of the transmission line. Moreover, when the impulse voltage continues to increase and is greater than the reverse breakdown voltage of the Schottky diode, it will cause the system to fail and form continuous reflection waveforms, making it difficult to obtain accurate test results. Therefore, its performance parameters and accuracy are difficult to meet user requirements.

[0020] The inventor proposes to design the pulse discharge of the transmission line of the dual-cable with an open terminal to increase the discharg...

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Abstract

The invention provides a double-cable transmission line pulse testing system. Through developing a TLP (Transmission Line Pulse) test system, a target of quantitatively evaluating the performance characteristic of an electro-static discharge (ESD) protecting circuit is realized in a manner of simulating a real electrostatic discharging manner by means of a short-pulse square wave, thereby increasing a testing energy which is applied to two ends of a tested device, and improving testing result accuracy. The transmission line pulse testing system comprises a voltage transmission line part for charging and discharging, an attenuating filtering circuit structure which is used for matching a system impedance and attenuating the waveform of a reflecting pulse, and a leakage current testing part which is used for evaluating inner damage of the tested device, wherein a different resistance type attenuator design method is adopted for an attenuator part for matching an impedance change after matching. A Basel wave filter is used as a filter for realizing waveform edge shaping and realizing rare overshoot.

Description

technical field [0001] The invention relates to the field of ESD electrostatic discharge testing, in particular to the testing of electrostatic discharge protection circuits. Background technique [0002] TLP is an analysis tool for testing the I-V characteristics of built-in electrostatic discharge protection integrated circuits or devices by using a short pulse square wave to simulate the energy of human body electrostatic discharge mode to bombard integrated circuit systems or devices. Using the TLP test method to test the ESD protection circuit, we can extract the action parameters of the protection circuit, and accurately obtain the breakdown voltage and current of the device, so as to see the characteristics of the protection circuit. The I-V curve before the device breakdown is the design The staff provided the data that can be used for research reference analysis. Finally, high-efficiency design changes are realized, and the development cycle is shortened, thereby g...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 张炯陈光徐帆程玉华
Owner SHANGHAI RES INST OF MICROELECTRONICS SHRIME PEKING UNIV
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