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A Capability-Based Test Instrument Interchange Method

A test instrument and instrument technology, applied in the field of capability-based test instrument exchange, can solve the problems of rising long-term maintenance costs of automatic test systems, reduce long-term maintenance and technical support costs, achieve smooth upgrades, and achieve instrument independence Effect

Active Publication Date: 2018-04-24
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

Therefore, as the hardware of the test system becomes obsolete, the long-term maintenance cost of the automatic test system caused by the replacement of the instrument will continue to rise

Method used

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  • A Capability-Based Test Instrument Interchange Method
  • A Capability-Based Test Instrument Interchange Method
  • A Capability-Based Test Instrument Interchange Method

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Embodiment Construction

[0050] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0051] Such as figure 1 with figure 2 As shown, the present invention provides a method for exchanging test instruments based on capabilities, comprising the following steps:

[0052] Step 1: Create a test program using capability 1 in the capability set;

[0053] Step 2: Use capability 1 to create a description model of the first instrument;

[0054] Step 3: Create the physical resource description information of the first instrument;

[0055] Step 4: In...

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Abstract

The invention proposes a method for exchanging test instruments based on capabilities, which overcomes the problem of difficulty in upgrading the test system due to tight binding between the test program and the test instrument in the traditional automatic test system. The ability-based test instrument interchange method of the present invention uses the ability to describe the test program, completely separates the test program from the test instrument, and uses the ability to model the test instrument, thereby realizing the dynamic allocation of resources during operation, so that it can be used at different times In the case of changing the source code of the test program and recompiling, replace outdated instruments or adopt newer, high-performance or low-priced instruments to achieve a smooth upgrade of the system and reduce the cost of long-term maintenance and technical support of the system.

Description

technical field [0001] The invention belongs to the technical field of automatic testing, and in particular relates to a capability-based testing instrument exchange method. Background technique [0002] Automatic testing systems (automatic testing systems) refer to systems that automatically measure, process data, and display or output test results in an appropriate manner with little or no human participation. Compared with manual testing, automatic testing saves time and effort, and can improve labor productivity and product quality. It plays an important role in production, scientific research and national defense. [0003] Commercial off-the-shelf products (COTS) are widely used in existing automatic test systems. There are dozens of types and tens of thousands of models of various test instruments widely used. Although it reduces the difficulty and development time of automatic test systems, commercial products are updated. Faster (typical cycle is 5 years), while the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06F9/50
Inventor 吴波宋斌刘毅方朋邱田华谭旭王帅
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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