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Drop height fitting method

A critical drop height and height technology, applied in strength characteristics, measuring devices, instruments, etc., can solve problems such as test result deviation, material denaturation, and increased workload

Inactive Publication Date: 2015-09-23
中华人民共和国昆山出入境检验检疫局 +1
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Problems solved by technology

Therefore, the legality of the test sampling point must be judged after the critical drop height is solved. If the sampling point is found to be illegal, it must be re-sampled and the HIC-drop height curve drawn. This step will increase the workload and be tested at the same time. Under the action of repeated impact, certain material denaturation may occur, which may lead to the deviation of test results

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Embodiment Construction

[0034] The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0035] In order to achieve the purpose of the present invention, such as figure 2 As shown, in one of the embodiments of the present invention, a drop height fitting method is provided, comprising the following steps:

[0036] S1. Maintenance of effective test point list: The drop tester performs impact test, obtains the drop data of the impact test point and generates a test point list, and performs conflict analysis when adding the drop data of the new impact test point to the already generated test point list. If there is no conflict, enter step S2 after generating a new valid test point list; if there is a conflict, delete the conflict point according to the conflict determination rule, generate a new valid test point list and enter step S2;

[0037] S2, determine whether cubic B-spline fitting is possible: according to the new list o...

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Abstract

The invention discloses a drop height fitting method which comprises the following steps: maintaining an effective test point list; determining whether cubic B-spline fitting is available or not; then performing cubic B-spline fitting or drop test guide; solving the critical drop height; determining whether an effective critical drop height is obtained or not, and then outputting the results or performing drop test guide. According to the invention, conflict points are deleted according to conflict decision rules to obtain effective test points, so that the cubic B-spline fitting can be carried out quickly, and the test efficiency can be improved; meanwhile, a cubic B-spline curve is used for curve fitting for the effective test points, so that fast solution to the critical drop height is realized, and the test efficiency is further improved; the drop test guide is carried out by adopting a successive approximation method, and probable proper test points are prompted for testing, so that the test efficiency is improved.

Description

technical field [0001] The invention relates to a method, in particular to a drop height fitting method. Background technique [0002] In the standard EN 1177-2008 "Shock-absorbing playground decking. Determination of critical drop height", a manual drawing solution method for critical drop height (HIC=1000) is given. This method has great inaccuracy, typical examples such as figure 1 shown, figure 1 Among them, m is the impact test point, H is the drop height, HIC is the critical drop height, and the corresponding point of HIC=1000 in the curve is the critical point. In the process of drawing, the drawing of the curve and the search for the critical drop height are completely dependent on the experience of the tester, the familiarity with the test, and to a certain extent, the psychological relationship when going to the test, so the results are very random and cannot be recurrent. [0003] At the same time, the standard requires that for a drop test result, the HIC val...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/303
Inventor 许斌周利英骆海清张学锋蔡建和钱烈辉刘辉强
Owner 中华人民共和国昆山出入境检验检疫局
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