Delay flip-flop

Abstract

A delay flip-flop comprises a clock module, a delay filtering module, a master-slave DICE latch module and an output module, wherein the master-slave DICE latch module outputs a corresponding data signal to the data output module according to a clock signal that is output from the clock module and an outer data signal that is received through the delay filtering module. The master-slave DICE latch module is composed of a master-grade module and a slave-grade module. The delay filtering module is used for preventing entering of a transient pulse which is caused by a single event effect into the register. The master-slave DICE latch module is used for correcting inner node upset which is caused by the single-particle effect. The delay filtering module performs a function of preventing a single event transient pulse. The master-slave DICE latch module prevents overturning of an inner storage node, thereby performing a function of preventing single event upset. A protective belt structure is added in layout design. The structure of the delay flip-flop effectively restrains single event latchup, and facilitates reduction of a single event transient pulse width in a circuit.

Description

technical field [0001] The invention relates to the field of semiconductor devices, in particular to a D flip-flop. Background technique [0002] When a semiconductor device is in a radiation environment, the surrounding energy particles will penetrate into the chip and generate ionizing radiation, which will generate a certain number of electron and hole pairs on the trajectory of the energy particles. These electrons and holes generated by the ionizing radiation of single energy particles may be absorbed by the internal nodes of the circuit under the action of the electric field, resulting in abnormal function of the semiconductor device. These effects are called single event effects. [0003] A single event effect is a random effect. In 1975, people discovered the abnormal flip phenomenon of Binder, communication satellites, and JK triggers. After continuous research, it was found that the factors that caused the abnormal flip phenomenon included high-energy protons, he...

AI Technical Summary

Problems solved by technology

D flip-flop is the most widely used sequential device in integrated circuits. This device will retain the error information after the occurrence of single-event reversal and single-event transient pulse, which will affect the subsequent operation, resulting in the error or collapse of the entire system, resulting in serious consequence

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