A self-calibration method for real-time temperature measurement system of mocvd equipment
A self-calibration and equipment technology, which is applied in the field of self-calibration of the real-time temperature measurement system of MOCVD equipment, can solve the problems of temperature deviation, epitaxial wafer growth temperature measurement cannot be guaranteed to be consistent and accurate, and achieve the effect of consistent growth temperature measurement
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[0054] In order to deeply understand the present invention, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0055] See attached figure 2 , the MOCVD equipment real-time temperature measurement system self-calibration method provided by the present invention comprises the following steps:
[0056] Step 1: According to the actual heat radiation ratio, in the attached figure 1 The points corresponding to the actual thermal radiation ratio are traced on the theoretical thermal radiation ratio-temperature curve shown;
[0057] Step 2: Substitute the value of temperature T corresponding to the point into
[0058]
[0059] respectively get m 1 and m 2 ;
[0060] in,
[0061] L(λ 1 ,T), the first wavelength λ 1 The corresponding actual thermal radiation power,
[0062] L(λ 2 ,T), the second wavelength λ 2 The corresponding actual thermal radiation power,
[0063] m 1 , the first waveleng...
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