Integrated test device for dynamic buckling of grids under temperature field
A test device and technology of temperature field, applied in the field of grid dynamic buckling integrated test device under temperature field, can solve the problems such as the inability to complete the grid dynamic buckling test, and achieve the effects of stable impact process, easy application, and convenient device operation
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[0030] The present invention will be further explained below in conjunction with the drawings:
[0031] Such as Figure 1-Figure 4 As shown, the integrated test device for dynamic buckling of the lattice frame in the temperature field of the present invention includes a suspension bracket 3, a first suspension link 1, a second suspension link 2, an impact hammer 6, a movable temperature control box 5, The trellis mounting frame 4, the positioning bracket 8, the horizontal moving guide 9, the temperature control box mounting frame 91 and the impact seat 7, the top of the suspension bracket 3 is provided with a mounting post 31 protruding to one side, the first suspension link 1 and The second suspension links 2 are parallel to each other and arranged side by side in the direction of movement of the impact hammer 6. The upper end of the first suspension link 1 is rotatably mounted on the mounting column 31 through the angle measuring shaft 32, and the angle measuring shaft 32 is in...
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