Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Self-tuning microwave plasma torch and self-tuning device thereof

A microwave plasma and self-tuning technology, applied in the field of chemical measurement, can solve the problems of unmatched system impedance, cumbersome operation, unfavorable instrument protection, etc., to improve operability and service life, reduce experience requirements, and be conducive to protection. Effect

Inactive Publication Date: 2015-03-25
中控全世科技(杭州)有限公司
View PDF1 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, the change of working gas, the change of analyte composition and concentration, the change of flow rate, the change of power, etc., or the system impedance cannot match, all make the reflected power of MPT in the working state in a non-optimal state, and the energy cannot be obtained. Effective utilization, so it is necessary to adjust the position of the reflective end face of the torch tube in order to make it work in an optimal state
[0003] The traditional MPT torch is realized by manual adjustment, which belongs to open-loop control, and has the following disadvantages: (1) It requires the experience of the operator; (2) The MPT spectrometer is frequently switched on and off to adjust the torch, which is cumbersome to operate and is not conducive to instrument protection; (3) The instrument is not closed during manual adjustment, which may easily cause microwave leakage; (4) In some non-optimal working conditions, the self-heating of the MPT torch brings inconvenience to the operator

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Self-tuning microwave plasma torch and self-tuning device thereof
  • Self-tuning microwave plasma torch and self-tuning device thereof
  • Self-tuning microwave plasma torch and self-tuning device thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] like figure 1 A self-tuning device for a microwave plasma torch is shown, the microwave plasma torch (4) includes a coupling antenna (5) and an adjustment member (6), characterized in that the device includes a microwave source (1), a control module (2), transmission device (3);

[0039] The microwave source is connected to the coupling antenna (5), the adjustment member (6) is connected to the transmission device (3), the transmission device (3) is connected to the control module (2), and the The control module (2) is connected to the microwave source;

[0040] Wherein, the microwave source generates a microwave electromagnetic field to provide microwave energy for the microwave plasma torch (4), and at the same time obtains the feedback information of the microwave plasma torch (4) from the coupling antenna (5), and the microwave source will reflect the reflected power value in the feedback information Extracted and fed back to the control module (2), the control mo...

Embodiment 2

[0050] like image 3 As shown, the microwave source in this embodiment is a magnetron microwave source containing a directional coupler, which includes a magnetron (8), an excitation waveguide (9), an attenuator (12), a detector (13 ), transfer module (15). The magnetron (8) is sequentially connected with the excitation waveguide (9), the adapter module (15), and the coupling antenna (5), and provides microwave energy for the microwave plasma torch (4) while receiving the microwave plasma torch (4) ) feedback information; at the same time, the transfer module (15) is connected to the attenuator (12) and the detector (13) in order to attenuate and transmit the feedback information; the detector (13) is connected to the control module (2 ) connected to extract the reflected power value from the feedback information and transmit it to the control module (2).

[0051] The adapter module (15) in this embodiment includes a directional coupler (10) and a waveguide coaxial adapter (...

Embodiment 3

[0055] like Figure 4 As shown, the microwave source in this embodiment is a magnetron microwave source including a three-port circulator, which includes a magnetron (8), an excitation waveguide (9), an attenuator (12), a detector ( 13), three-port circulator (14). The magnetron (8) is sequentially connected with the excitation waveguide (9), the three-port circulator (14), and the coupling antenna (5), and provides microwave energy for the microwave plasma torch (4) while receiving the microwave plasma torch ( 4) feedback information; at the same time, the three-port circulator (14) is sequentially connected to the attenuator (12) and the detector (13) to attenuate and transmit the feedback information; the detector (13) is connected to the control module (2) are connected, and are used to extract the reflected power value from the feedback information and transmit it to the control module (2).

[0056] Port 1 of the three-port circulator (14) is connected to the excitation...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a self-tuning microwave plasma torch and a self-tuning device of the self-tuning microwave plasma torch. The microwave plasma torch (4) comprises a coupled antenna (5) and a regulating part (6). The self-tuning device comprises a microwave source, a control module (2) and a transmission device (3). The microwave source is connected with the coupled antenna (5). The regulating part (6) is connected with the transmission device (3). The transmission device (3) is connected with the control module (2). The control module (2) is connected with the microwave source. The microwave source generates a microwave electromagnetic field to provide microwave energy for the microwave plasma torch (4) and acquires feedback information of the microwave plasma torch (4) from the coupled antenna (5) at the same time; the microwave source extracts a reflection power value from the feedback information and feeds back the reflection power value to the control module (2); the control module sends a control signal to the transmission device (3) according to the reflection power value and a preset parameter relation curve, and the transmission device (3) drives the regulating part (6) to move.

Description

technical field [0001] The invention relates to the technical field of chemical measurement, in particular to a self-tunable microwave plasma torch and a self-tuning device thereof. Background technique [0002] The microwave plasma torch (MPT) was invented by Professor Jin Qinhan in 1985, and the corresponding patent application number is CN 94205428.8. At present, the microwave plasma torch (MPT) has been commercially used in sequential scanning spectrometers, full-spectrum direct-reading spectrometers, etc. However, during the use of these MPT spectrometers, once the parameters of the system change, it is necessary to adjust the reflective end face of the torch. For example, the change of working gas, the change of analyte composition and concentration, the change of flow rate, the change of power, etc., or the system impedance cannot match, all make the reflected power of MPT in the working state in a non-optimal state, and the energy cannot be obtained. Therefore, it ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H05H1/30
Inventor 金伟于丙文朱旦金钦汉叶莹徐星王熙星
Owner 中控全世科技(杭州)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com