Particle six-sided inspection machine

Abstract

The invention discloses a particle six-sided inspection machine. The particle six-sided inspection machine comprises a stander and a control system, and is characterized in that the control system is fixedly installed on the stander, a conveying device, a guiding device and a detection device are fixedly installed on the stander, the conveying device is electrically connected with the control system, the conveying device is communicated with the guiding device through a guide rail, the detection device is electrically connected with the control system, the detection device comprises a position detection part and a detector, the position detection part is installed on one end of the guiding device, the other end of the guiding device is provided with a sorting device, the sorting device is fixedly installed on the stander, the sorting device is electrically connected with the control system, and a detector is arranged between two ends of the guiding device. The particle six-sided inspection machine is complete in function, compact and reasonable in structure, capable of efficiently and precisely judging that whether the product quality is qualified or not and capable of separating the qualified products and unqualified products.

Description

technical field [0001] The invention relates to the detection of regular hexahedral products, in particular to a particle hexahedral inspection machine for detecting patch resistance on a substrate. Background technique [0002] At present, the production process of chip electronic components, such as chip resistors, is mostly screen printing, and several related layers are printed by screen printing, so the chip resistors produced by this method have their specific structures. , the relevant structure must be guaranteed to be in a very precise position to become a qualified chip resistor, and one of the ways to judge whether the quality is qualified is "position detection", that is, to detect the position of the relevant structure and the positional relationship between them , in order to judge the quality of the produced chip resistors. At present, this detection method is often manually inspected with the naked eye or a magnifying glass, which has low precision, large er...

AI Technical Summary

Problems solved by technology

At present, the detection method is often manually inspected with the naked eye or a magnifying glass, which has low precision, large errors, and low efficiency, and cannot meet the requirements of industrial production.

In addition, there are also relevant patents that mention the use of mechanical methods for detection, but the detection equipment has a complex structure, single function, and low inspection efficiency, which is not enough to meet the requirements of modern industrial production for high integration, high automation, and high efficiency of equipment.

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