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Structural illumination-based random scattering optical beyond-diffraction-limit imaging system and method

A super-diffraction limit, imaging system technology, applied in optics, optical components, instruments, etc., can solve problems such as time-consuming, complicated imaging process, and difficulty in real-time observation, and achieve improved imaging resolution, simple preparation process, and imaging resolution rate-enhancing effect

Active Publication Date: 2014-10-15
XIDIAN UNIV
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Problems solved by technology

However, because the spatial resolution it achieves is at the expense of the time resolution, the imaging process is complicated and time-consuming, making it difficult to achieve real-time observation

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  • Structural illumination-based random scattering optical beyond-diffraction-limit imaging system and method
  • Structural illumination-based random scattering optical beyond-diffraction-limit imaging system and method
  • Structural illumination-based random scattering optical beyond-diffraction-limit imaging system and method

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Embodiment Construction

[0027] The setup of the random scattering optics super-diffraction limit imaging system under structured light illumination of the present invention and the implementation steps of the imaging method will be clearly and completely described below in conjunction with the accompanying drawings.

[0028] see figure 1 , the imaging system of the present invention includes two parts: an optical sub-device and a super-diffraction-limited imaging device. in:

[0029] The optical sub-assembly includes a light source 1 , two aperture stops, a beam expander 3 , a spatial light modulator 4 , four lenses, a λ / 4 wave plate 6 , three mirrors and a light baffle 12 . Among them, the light source 1 adopts a laser in the visible light band, and the beam emitted by the laser passes through the first aperture stop 2 to filter the stray light in the beam, expands the beam through the beam expander 3, and controls the beam in the spatial light modulator through the first mirror 7 The incident dir...

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Abstract

The invention discloses a structural illumination-based random scattering optical beyond-diffraction-limit imaging system and method. The objective of the invention is mainly to solve the problems of complicated techniques, long imaging time, difficult realization of system structure and low imaging resolution of existing similar technologies. The imaging system includes a light source, a beam expander, a spatial light modulator, a lambda / 4 wave plate, a beam expanding lens group, a light blocking plate, lenses, a random scattering medium, a convergence lens, and a CCD camera; light beams emitted by the light source are subjected to beam expansion of the beam expander and thereafter enter the spatial light modulator, so that 0-level light and + / -1-level light are obtained; the 0-level light and + / -1-level light pass through the lambda / 4 wave plate, so that circularly polarized light can be obtained; after being subjected to beam expansion of the beam expanding lens group, the circularly polarized light reaches the light blocking plate, and the + / -1-level light is reserved; the + / -1-level light is interfered when passing through the lenses, and structural light can be generated, and an observation target can be illuminated; and the illuminated observation target enters the random scattering medium, and strong scattering occurs, and light beams enter the CCD camera through the convergence lens. The structural illumination-based random scattering optical beyond-diffraction-limit imaging system of the invention has the advantages of simple structure and high imaging resolution, and can be used for optical super resolution imaging.

Description

technical field [0001] The invention belongs to the field of imaging technology, in particular to an optical imaging system, which can be used for optical super-resolution imaging. Background technique [0002] The resolution of traditional optical imaging is limited by the diffraction limit, and it is difficult to measure distances less than 200nm in the visible light range. Therefore, the research on breaking through the diffraction limit imaging of optical systems is extremely urgent. [0003] At present, remarkable progress has been made in the research of near-field and far-field super-diffraction-limited imaging. The near-field superdiffraction-limited imaging method mainly uses nanoprobes, plasmonic supermaterials, and perfect lenses made of negative refractive index materials to detect evanescent waves, and its resolution is not limited by the Rayleigh criterion. However, since the preparation of nanoprobes, plasmonic supermaterials, and negative refractive index ma...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B27/42G02B27/58
Inventor 邵晓鹏吴腾飞代伟佳石慧明龚昌妹骆秋桦刘飞杜娟彭立根李慧娟
Owner XIDIAN UNIV
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