Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Full-tensor magnetic field gradiometer based on giant magnetic impedance effect

A giant magneto-impedance and gradiometer technology, applied in the field of gradiometers, can solve the problems of difficulty in measuring the full tensor magnetic field gradient, low requirements for use environment, and large gradiometer size, and achieves rich magnetic field gradient information, wide frequency response range, Reliable effect

Active Publication Date: 2014-09-24
BEIHANG UNIV
View PDF5 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0017] The purpose of the present invention is to solve the shortcomings of traditional gradiometers such as large size, low precision, low requirements for the use environment and difficulty in measuring the full tensor magnetic field gradient, and propose a full tensor magnetic field gradiometer based on the giant magnetoimpedance effect. The huge impedance change produced by the material under the action of a magnetic field is a high-sensitivity, micro-sized full sheet made by converting the impedance change caused by the magnetic field into a voltage signal through a dual-arm differential Wheatstone bridge combined with thin-film micromachining technology magnetic field gradiometer

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Full-tensor magnetic field gradiometer based on giant magnetic impedance effect
  • Full-tensor magnetic field gradiometer based on giant magnetic impedance effect
  • Full-tensor magnetic field gradiometer based on giant magnetic impedance effect

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.

[0037] A full tensor magnetic field gradiometer based on the giant magneto-impedance effect of the present invention is used to measure the variation of the spatial magnetic field along various directions, such as figure 1 , figure 2 , image 3 As shown, including X-Y gradiometer, Z gradiometer and signal leads;

[0038] X-Y direction gradient meter such as figure 2 As shown, including a cross-shaped substrate and a giant magneto-impedance film, one end of the cross-shaped substrate in the X direction is provided with two holes, and the holes are respectively provided with a giant magneto-impedance film R_x1 and a giant magneto-impedance film R_x4, and the other end of the X-direction is provided with There are two holes, and there are giant magnetoresistance films R_x2 and giant magnetoresistance films R_x3 respectively in the holes; there are t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a full-tensor magnetic field gradiometer based on the giant magnetic impedance effect. The full-tensor magnetic field gradiometer comprises an X-Y-direction gradiometer body, a Z-direction gradiometer body and signal leads. The X-Y-direction gradiometer body comprises a cross-shaped substrate and a giant magnetic impedance thin film, the Z-direction gradiometer body comprises a rectangular substrate and a giant magnetic impedance thin film, a junction point at the input end and a junction point at the output end of an electric bridge are connected with the signal leads, and the signal leads are arrayed symmetric with the geometric center of the whole gradiometer as the three-dimensional center. The full-tensor magnetic field gradiometer has the advantages of being high in accuracy, minimized, low in cost, wide in frequency response, rich in information and the like. Due to the design of preparing a three-dimensional structure through planar thin films, the problem of space consistency of the full-tensor magnetic field gradiometer based on the giant magnetic impedance thin films is solved, and the magnetic field gradient measuring sensor with the size at the chip level is designed for the first time.

Description

technical field [0001] The invention relates to a full tensor magnetic field gradiometer based on giant magneto-impedance effect, belonging to the technical field of gradiometers. Background technique [0002] The so-called full tensor vector magnetic field gradient refers to the amount of change of the three components of the magnetic field vector along the direction of the three-dimensional space base. The measurement of the full tensor vector magnetic field gradient information is composed of a magnetic sensor as a basic unit through a reasonable spatial arrangement and an appropriate connection. According to the measurement principle of the magnetic field, it can be divided into Hall effect, magnetoresistance effect, giant magnetoresistance effect, giant magnetoresistance effect, nuclear precession, superconducting quantum interferometer (SQUID) and so on. Due to the limitations of the principle, the full tensor magnetic field gradiometer based on the Hall effect is gre...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/022
Inventor 王三胜张明吉贺同福
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products