An integrated delay test system for optical and electronic transformer separation units

Abstract

The invention discloses an integrated system for testing the delay of separated units of an optical electronic transformer. The integrated system for testing the delay of the separated units of the optical electronic transformer comprises a standard transformer, an I / U converter, an A / D acquisition circuit, a CPU and an upper computer, wherein the CPU is connected with a digital quantity acquisition module based on an FPGA, a serial data interface of the digital quantity acquisition module based on the FPGA is externally connected with a collector, and an Ethernet data interface is externally connected with a combining unit. The integrated system for testing the delay of the separated units of the optical electronic transformer has all the functions of a conventional optical electronic transformer calibrator, process testing is added, testing of the separating time characteristic of the optical electronic transformer can be achieved through the system, the delay time of all the separated units of the optical electronic transformer can be tested accurately, and detection data are provided for testing of the separated units of the field optical electronic transformer of an intelligent substation.

Description

technical field [0001] The invention relates to an integrated time-delay test system for an optical and electronic transformer separation unit, which belongs to the technical field of electric power measurement. Background technique [0002] With the continuous improvement of processing technology, optical electronic transformers have gradually occupied a place in the application field of electronic transformers. However, since optical electronic transformers generally adopt the principle of magneto-optic or electro-optical, their sensing and measuring units are basically Both use the method of measuring the optical step length to obtain the current and voltage values. The analog signal containing current and voltage is transmitted in the optical fiber loop between the collector and the sensor head, and the signal delay is related to the length of the optical fiber on site and the angle of incidence. Generally, after the delay is repaired in the collector, the information i...

AI Technical Summary

Problems solved by technology

[0005] The invention provides an integrated delay test system for the separation unit of the optical electronic transformer, which solves the problem that the correction based on time is difficult to locate and prone to repair errors in the testing process of the optical electronic transformer

Images