Method and device for accurate thickness detection of ultrasonic equivalent peak value

Abstract

The invention discloses a method for accurately detecting the thickness through an ultrasonic wave equivalent peak value. The method includes the steps of detection of ultrasonic wave echo rising edge arrival time Ts, detection of ultrasonic wave echo falling edge arrival time Tx and calculation of echo peak value time Tf, wherein the thickness of a measured object can be obtained by substituting the echo peak value time Tf into an ultrasonic wave thickness measuring calculation formula S=V*Tf / 2. The invention further discloses a device using the method. The method and the device have the advantages that measuring accuracy is improved, and the error is reduced to 0.001 mm or lower; elements are less influenced by the coupling degree, and measuring stability is improved; the phase error is basically eliminated; miniaturization can be more easily achieved, and the area occupied by a timing chip is about one tenth the area occupied by an existing timing circuit; material difference of the measured object does not influence thickness measurement; spreading of ultrasonic waves can be influenced by the pressure and temperature of an ultrasonic probe, and accuracy can be controlled within the range of 0.02 mm through the method.

Description

technical field [0001] The invention relates to a thickness detection method, in particular to a method for measuring thickness by using ultrasonic waves, and also relates to a device used in the detection method. Background technique [0002] The principle of ultrasonic measurement of thickness is similar to that of light wave measurement. The ultrasonic pulse emitted by the probe reaches the object to be measured and propagates in the object, and is reflected back to the probe when it reaches the interface of the material. The thickness of the object to be measured is determined by accurately measuring the propagation time of the ultrasonic wave in the material. The calculation formula is S=v* t / 2, where S is the thickness of the measured object, v is the propagation velocity of the ultrasonic wave in the material of the measured object, and t is the propagation time of the ultrasonic wave in the material of the measured object. [0003] The starting point of the ultrason...

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Problems solved by technology

Therefore, this will greatly increase the instrument cost of the ultrasonic thickness gauge, which is difficult to accept in terms of cost

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