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A Noise Figure Measurement Method and Noise Figure Standard Device

A technology of noise figure and measurement method, applied in the field of measurement, can solve problems such as noise figure measurement of incapable devices

Active Publication Date: 2017-05-10
NO 722 RES INST OF CHINA SHIPBUILDING IND
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The existing high-temperature noise source and low-temperature noise source work in the frequency range of 10MHz-26.5GHz, so this method can only measure the high-frequency (frequency band greater than 10MHz) noise figure of the device, and cannot measure the low-frequency (frequency less than 10MHz) noise figure of the device. frequency band) to measure the noise figure

Method used

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  • A Noise Figure Measurement Method and Noise Figure Standard Device
  • A Noise Figure Measurement Method and Noise Figure Standard Device
  • A Noise Figure Measurement Method and Noise Figure Standard Device

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Embodiment 1

[0033] An embodiment of the present invention provides a noise figure standard, see figure 1 , the noise figure standard device includes an input matching unit 1, a first-stage amplifying circuit 2, and an output matching unit 3, the first-stage amplifying circuit 2 is electrically connected to the input matching unit 1 and the output matching unit 3 respectively, and the first-stage amplifying circuit The circuit includes multiple operational amplifiers connected in parallel.

[0034] Preferably, the multiple operational amplifiers connected in parallel may be integrated chip components.

[0035] Preferably, the number of operational amplifiers is four, which can reduce the cost of the noise figure standard by using as few operational amplifiers as possible while reducing the noise level of the first-stage amplifying circuit.

[0036] Specifically, the first-stage amplifying circuit 2 includes a first operational amplifier U1, a second operational amplifier U2, a third opera...

Embodiment 2

[0061] An embodiment of the present invention provides a noise figure measurement method, see image 3 , the method includes:

[0062] Step 101: Provide a noise figure standard. The etalon may be the etalon in Embodiment 1, and its structure will not be repeated here.

[0063] In this embodiment, the noise figure of the noise figure standard at each low-frequency frequency point is a constant value. The noise figure of the noise figure standard can be different at different low frequency points.

[0064] Specifically, the range of the low frequency point may be 20 Hz-100 kHz.

[0065] Preferably, before step 101, the method may further include the step of: assessing the noise figure standardizer according to the national standard, and obtaining the fixed noise figure value of the noise figure standardizer at each low-frequency frequency point.

[0066] Understandably, when the noise figure standard is assessed according to the national standard, the noise figure standard i...

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Abstract

The invention discloses a noise coefficient measuring method and a noise coefficient standard device and belongs to the technical field of measurement. The noise coefficient measuring method comprises the steps that the noise coefficient standard device is provided, wherein the noise coefficients of the noise coefficient standard device at low frequency points are the constant values; a noise coefficient measurer is adopted to measure the noise coefficient standard device, and noise coefficient measurement values of the noise coefficient standard device at the low frequency points to be measured are obtained; the noise coefficient measurer is adopted to measure a device to be measured, and noise coefficient measurement values of the device to be measured at the low frequency points to be measured are obtained; the noise coefficients of the device to be measured at the low frequency points to be measured are calculated according to the constant noise coefficient values of the noise coefficient standard device at the low frequency points to be measured, the noise coefficient measurement values of the noise coefficient standard device at the low frequency points to be measured, and the noise coefficient measurement values of the device to be measured at the low frequency points to be measured. The noise coefficient measuring method and the noise coefficient standard device solve the problem that the low-frequency noise coefficients of the device cannot be measured in the prior art.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to a noise figure measurement method and a noise figure standard. Background technique [0002] The noise figure of a device refers to the ratio of the signal-to-noise ratio at the input of the device to the signal-to-noise ratio at the output of the device, which is used to measure the noise level of the device itself. [0003] Now the following method is usually used to measure the noise figure of the device: respectively connect the input end of the device under test to a high-temperature noise source and a low-temperature noise source with known noise temperature, and use a power indicator to measure the power at the output end of the device under test; as follows The formula calculates the noise figure of the device under test: Among them, F is the noise figure, T h is the noise temperature of the high temperature noise source, P h is the power measured by the power ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/26
Inventor 毛勇杨军周志宇江传华郑松峰
Owner NO 722 RES INST OF CHINA SHIPBUILDING IND
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