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Integrated pre-amplifier used for charged particle detector

A preamplifier, charged particle technology, applied in amplifiers, improving amplifiers to reduce noise effects, amplifying device components, etc., can solve the problems of low circuit reliability, complex structure, heavy weight, etc., to reduce volume and weight. , the effect of improving the signal-to-noise ratio and simplifying the structure

Active Publication Date: 2014-06-25
NAT SPACE SCI CENT CAS
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Problems solved by technology

[0004] The purpose of the present invention is to solve the technical problems of the existing preamplifiers, which are complex in structure, large in size, heavy in weight, high in power consumption, and low in circuit reliability due to the large number of peripheral components. Integrated preamplifier for charged particle detectors, the integrated preamplifier can realize the measurement of charged particles with deposition energy greater than 57keV; it can be used for high energy electrons, proton detectors and heavy ion detectors, and can also be used for other charged particle measurements field

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  • Integrated pre-amplifier used for charged particle detector

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Embodiment Construction

[0032] The method of the present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0033] An integrated preamplifier for a charged particle detector of the present invention, the integrated preamplifier cooperates with a semiconductor detector to measure charged particles with deposition energy greater than 57keV, and can be adjusted according to the charge-sensitive feedback capacitance of different external capacitances The amplifier charge is sensitively magnified and converted into a corresponding voltage signal output, which is realized by integrated circuit technology, that is, active and passive devices are fabricated on the same semiconductor substrate to realize the design of an integrated preamplifier, such as figure 1 As shown, the integrated preamplifier includes: a signal preprocessing circuit, a charge sensitive preamplifier circuit, a pulse shaping circuit and a DC bias circuit. The signal preprocessing ...

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Abstract

The invention provides an integrated pre-amplifier used for a charged particle detector. The integrated pre-amplifier comprises a signal preprocessing circuit, a charge sensitivity pre-amplification circuit, a pulse shaping circuit and a direct-current biasing circuit. The signal preprocessing circuit is used for preprocessing a charge signal generated by the detector and outputting a pulse signal; the charge sensitivity pre-amplification circuit is used for converting the pulse signal output by the signal preprocessing circuit to a voltage signal; the pulse shaping circuit is used for carrying out pulse shaping output on the voltage signal output by the charge sensitivity pre-amplification circuit; the direct-current biasing circuit carries out biasing on the quiescent operating point of an amplifier in the charge sensitivity pre-amplification circuit and the quiescent operating point of an amplifier in the pulse shaping circuit through resistor voltage division; the signal preprocessing circuit, the charge sensitivity pre-amplification circuit, the pulse shaping circuit and the direct-current biasing circuit are integrally connected. The integrated pre-amplifier can achieve measurement of charged particles with sedimentary energy larger than 57 keV.

Description

technical field [0001] The invention relates to the technical field of amplifiers, in particular to an integrated preamplifier for charged particle detectors. Background technique [0002] At present, in the measurement of charged particles, most of them use semiconductor detectors. When charged particles with a certain energy enter the detector, part or all of their energy is lost in the detector and absorbed by the detector. At this time, the output pulse amplitude depends on the size of the incident particle energy. Generally speaking, the magnitude of the output pulse amplitude is millivolts / megaelectronvolts, and it is difficult for the instrument to measure it directly. Therefore, the demand for pre-amplification of the weak pulse output by the semiconductor detector is proposed. The pre-amplifier is a charged particle detector. an important component of . [0003] In the past, the preamplifiers in particle detectors mostly used discrete components or operational amp...

Claims

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Application Information

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IPC IPC(8): H03F1/26H03F1/00
Inventor 沈国红朱光武梁金宝孙越强荆涛张焕新
Owner NAT SPACE SCI CENT CAS
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