Crystal boundary density measuring method

Abstract

The invention provides a crystal boundary density measuring method which includes the steps as follows: displaying crystal boundaries; obtaining an image; calculating an image area S based on an amplification multiple, the obtained image area S=(photograph measurement length a / amplification multiple M)*(photograph measurement width b / amplification multiple M); measuring all the crystal boundary lengths in the observation scope and summing all the measured crystal boundary lengths with a summation result being L, wherein the lengths are measured in that: each crystal boundary is subjected to differential processing with an end point coordinate of each differential unit being (x1,y1) (x2,y2), so that a differential unit length l is calculated by a formula as follows, all the differential unit lengths are summed and the crystal boundary length L is obtained; finally calculating a crystal boundary density A=L / S. The measuring method solves the problem that the measuring precision is low because of the little quantity of crystal grains.

Description

technical field [0001] The invention relates to a metallographic inspection method, in particular to a grain boundary density measurement method. Background technique [0002] The grain size of steel is closely related to its performance, and the quantitative analysis of grain size provides important data support for improving the performance of materials. The method of "GB / T6394-2002 Determination of Average Metal Grain Size" stipulates the method for the determination of average metal grain size, and the average grain size is measured by comparison method, intercept method and area method. The comparison method can only roughly represent the grain size, and cannot perform quantitative analysis; the area method is greatly affected by the grain count in the measured area, especially the incomplete grain count at the edge of the measured area has a greater impact on the measurement results; the intercept point The method is a relatively accurate method, and the measurement r...

AI Technical Summary

Problems solved by technology

[0004] The object of the present invention is to provide a more accurate method for quantifying grain boundaries, introduce a method for measuring grain boundary density, and solve the problem of low measurement accuracy due to the small number of crystal grains

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