SRAM type FPGA single particle irradiation test system and method

Abstract

The invention provides an SRAM type FPGA single particle irradiation test system and method. The test system comprises a host computer, a current monitoring acquisition plate and a test plate. The current monitoring acquisition plate comprises a current monitoring acquisition FPGA, a current acquisition unit, a power supply module and a first communication interface; the test plate comprises a control processing FPGA, a refreshing chip, an SRAM, a configuration PROM, a storage PROM, a second communication interface and a detected FPGA; the host computer is in charge of flow control and data processing; the current monitoring acquisition plate is in charge of power-on and power-off of the test plate and monitoring and testing of FPGA currents; and the test plate is in charge of processing a command sent by the host computer and performing work such as single particle overturning, single particle function interruption detection and the like. According to the invention, the refreshing chip is utilized to replace some of the reconfiguration modules in a conventional irradiation test system so that a detected chip can be more conveniently and reliably refreshed; and the system and method provided by the invention can realize static and dynamic overturning testing on a trigger, and more reliable trigger overturning data can be obtained by combing the two methods.

Description

technical field [0001] The invention relates to a SRAM type FPGA single particle irradiation test system and method. Background technique [0002] In the field of aerospace applications, the demand for integrated circuits continues to increase, and large-scale, highly integrated integrated circuits are becoming more and more common. FPGAs occupy an important seat in aerospace integrated circuits. Integrated circuits operating in space will be directly exposed to the space radiation environment, and the effects of radiation will cause FPGA performance to degrade, and may lead to functional errors or even failure in severe cases. The effect of space radiation is divided into single event effect and total metering effect, and the single event effect has a more obvious impact on SRAM FPGA. Therefore, before the FPGA is applied in the space system, it must be fully evaluated by the radiation test. According to the evaluation results, the radiation-sensitive units are strengthen...

AI Technical Summary

Problems solved by technology

At present, the partial reconfiguration operation of the existing single particle irradiation test system is to use the control chip in the control system to perform partial reconfiguration operation. This method is complicated to implement, difficult to debug, and prone to unsuccessful reconfiguration.

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