Optical waveguide parameter testing clamp

Abstract

The invention relates to an optical waveguide parameter testing clamp which comprises a base, an optical waveguide clamp, a longitudinal guiderail, a set of fixed transverse guiderails, an input prism clamp, a set or multiple sets of slide transverse guiderails and an output prism clamp. The fixed transverse guiderails, the longitudinal guiderails and the optical waveguide clamp are mounted on the base. The slide transverse guiderails are mounted on the longitudinal guiderail. The input prism clamp is mounted on the fixed transverse guiderails. The output prism clamp is mounted on the slide transverse guiderails. The optical waveguide clamp is located at the position close to the tail ends of the fixed transverse guiderails and the slide transverses guiderails. The output prism clamp can be replaced by a CCD camera. The optical waveguide parameter testing clamp can be used for clamping prism couplers, to-be-tested waveguides, detectors and the like. In addition, the optical waveguide parameter testing clamp is applicable to various waveguide parameter measuring methods, novel and simple in structure, high in testing precision, good in repeatability, convenient to operate, wide in application range, and the like.

Description

technical field [0001] The invention relates to the field of optical waveguide technology, in particular to an optical waveguide parameter testing fixture, which is used for measuring optical waveguide parameters such as transmission loss, refractive index and its distribution, and waveguide layer thickness of the optical waveguide and its components. Background technique [0002] Optical waveguide is the most basic unit of integrated optical circuit and its components. It is the most potential basic structure to realize optoelectronic integration and photonic devices. It acts like a wire in a circuit and is used to realize the optical connection between different devices. Light waves mainly play the role of limitation, transmission and coupling. Due to the small propagation loss, the fabrication cost is low, and it is easy to integrate with other optoelectronic components. In order to improve the performance of various optical waveguide devices, the characterization of var...

AI Technical Summary

Problems solved by technology

Therefore, the research and development of the optical waveguide parameter test fixture is known to be concerned by relevant researchers. For example, the patent document CN 101839799A discloses an optical waveguide test device, which is mainly used for clamping the optical waveguide to be tested and the prism coupler, but the device directly Pressing the prism on the surface of the optical waveguide cannot adjust the gap between the bottom surface of the prism and the surface of the optical waveguide to be tested. The coupling efficiency of the optical waveguide is very low, which increases the difficulty of testing and the requirements of the detector, and the test accuracy will also be affected.

Moreover, the output coupling prism of this device cannot be moved, and the optical waveguide fixture can only hold a fixed-sized optical waveguide to be tested and there is no light-through space reserved on the bottom surface, so the applicable test methods of this device are limited.

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