Mechanical wearing part performance assessment and prediction method based on EMD (empirical mode decomposition)-SVD (singular value decomposition) and MTS (Mahalanobis-Taguchi system)
A technology for mechanical wear and prediction methods, which is applied in the testing of mechanical components, testing of machine/structural components, measuring devices, etc. It can solve the problems of non-stationary nonlinear signal processing difficulties, inaccurate health assessment, and unsuitability for industrial applications. , to reduce the probability of failure, improve accuracy, and improve real-time performance
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0074] This example collects the signal from the tool on the milling machine for verification. The method based on EMD-SVD and MTS in the present invention is used to evaluate and predict the performance of the cutting tool, and obtain the confidence value curve of the cutting tool. Method concrete steps of the present invention are as follows:
[0075] Step 1: Collect signals.
[0076] According to the characteristics of the tool, install the vibration sensor and collect the original signal, such as figure 2 Indicated by x. figure 2 The abscissa in represents the number of collection points, and the ordinate represents the amplitude.
[0077] Step two, feature extraction.
[0078] EMD decomposition is performed on the signal in step 1 to obtain IMF components and residual functions, such as figure 2 shown. The four IMF components IMF1~IMF4 and the residual function r form an initial matrix, and perform SVD to obtain the eigenvalues of the signal, and normalize the ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com