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Joint optimization algorithm for rapid inversion of single-layer surface dielectric parameters and roughness parameters based on radar backscattering measured data

A technology of backscattering coefficients and measured data, applied in the field of microwave remote sensing, can solve problems such as limited application range, slow calculation speed, and inability to guarantee the total inversion accuracy of multi-parameters, so as to broaden the application range, realize real-time prediction, and overcome calculation problems. long time effect

Active Publication Date: 2017-02-08
XIDIAN UNIV
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Problems solved by technology

At present, there are four main paths for inversion research: one is the empirical formula method, such as Oh model, Dubois model and Shi model, etc., but their respective scope of application is limited
Second, the optimization algorithm combines the surface electromagnetic scattering model and radar measured data to invert the dielectric parameters and roughness parameters of the rough surface. When the electromagnetic scattering model is more complex, the calculation speed is quite slow
The traditional support vector machine (SVM) can only perform inversion of surface single parameters, so the total inversion accuracy of multiple parameters cannot be guaranteed. For the situation where multiple surface parameters are unknown at the same time, SVM becomes powerless
Compared with SVM, M-SVR has multi-parameter inversion capability, and has the advantages of high precision and fast speed. According to the current domestic and foreign data, the application of M-SVR to surface electromagnetic parameter inversion has not been reported.

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  • Joint optimization algorithm for rapid inversion of single-layer surface dielectric parameters and roughness parameters based on radar backscattering measured data
  • Joint optimization algorithm for rapid inversion of single-layer surface dielectric parameters and roughness parameters based on radar backscattering measured data
  • Joint optimization algorithm for rapid inversion of single-layer surface dielectric parameters and roughness parameters based on radar backscattering measured data

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Embodiment Construction

[0025] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0026] like figure 1 As shown in the figure, the joint optimization algorithm for fast inversion of single-layer surface dielectric parameters and roughness parameters based on the measured data of radar backscattering, the specific implementation steps are as follows:

[0027] Step 1: Obtain the co-polarization ratio according to the measured data of the backscatter coefficient of the surface radar

[0028] Step 2: Calculate the Small Slope Approximation (SSA) Backward Copolarization Ratio of Rough Surface Electromagnetic Scattering

[0029] p ( ε ′ , ε ′ ′ , θ i ) = σ hh 0 / σ vv 0 ...

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Abstract

The invention discloses a combined optimization algorithm of an inheritance multi-output support vector machine. The combined optimization algorithm combines with measured radar back scattering data for fast inversion of single-layer earth surface (root-mean-square height ksigma<1.5, and root-mean-square slope s<0.3) dielectric parameters and roughness parameters. The algorithm includes: using single-layer earth surface HH and VV measured polarizing radar back scattering coefficient data to obtain homo-polarization ratio; using a rough earth surface electromagnetic scattering small slope approximation method to calculate back homo-polarization ratio; combining a genetic algorithm with the small slope approximation homo-polarization ratio and the measured data to invert the earth surface dielectric constant; substituting the inversion result into an electromagnetic scattering integral equation model to generate a data file of back scattering coefficient changing with roughness; combining two kinds of measured polarized radar back scattering data to form a target function, using M-SVR optimization algorithm to invert the earth surface roughness parameters, and evaluating inversion errors and efficiency. By the combined optimization algorithm, real-time prediction of earth surface parameters can be achieved while inversion precision is guaranteed.

Description

technical field [0001] The invention relates to the technical field of microwave remote sensing, in particular to a joint optimization algorithm for fast inversion of single-layer surface dielectric parameters and roughness parameters based on radar measured data. Background technique [0002] The research on electromagnetic scattering and electromagnetic inverse scattering plays an extremely important role in microwave remote sensing. The radar technology of ground-based microwave remote sensing has made great progress in recent years. In the microwave remote sensing of typical surfaces such as land and ocean, the backscattered echoes are closely related to the physical parameters of the surface and soil moisture, etc., and contain a lot of surface information. For example, the soil moisture content can be obtained by using surface microwave remote sensing technology. Therefore, scientific research in the field of inverse scattering will have a significant impact on the dev...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F19/00
Inventor 吴振森张元元苏翔李海英令狐龙翔
Owner XIDIAN UNIV
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