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Dual-frequency Doppler lidar measurement system based on single-solid fp etalon four-edge technology

A Doppler laser and edge technology technology, applied in the field of dual-frequency Doppler lidar measurement systems, can solve the problem of not fully exploiting the spectral characteristics of FP interferometers

Inactive Publication Date: 2017-04-05
YANCHENG TEACHERS UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In this way, no matter from the perspective of detection signal-to-noise ratio or from the perspective of system frequency discrimination sensitivity, the spectral characteristics of the FP interferometer may not be fully exploited

Method used

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  • Dual-frequency Doppler lidar measurement system based on single-solid fp etalon four-edge technology
  • Dual-frequency Doppler lidar measurement system based on single-solid fp etalon four-edge technology
  • Dual-frequency Doppler lidar measurement system based on single-solid fp etalon four-edge technology

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Embodiment Construction

[0030] exist figure 2 Among them, the external cavity semiconductor laser (1) is respectively connected with the trigger circuit (34) and the laser driving power supply (36), and the seed laser emitted by the external cavity semiconductor laser (1) passes through the first convex lens (2), the acousto-optic frequency shifter (3), the first optical isolator (4), the second convex lens (5), the third convex lens (6), horn-shaped diode amplifier (7), the second optical isolator (8) and then the beam splitter (9) be divided into two beams, after the transmitted light beam expands the beam by the beam expander (10), through the first 45 degree reflector (11), the second 45 degree reflector (12) and the Cassegrain telescope (16) After the third 45-degree reflector (13), it shoots into the two-dimensional scanner (14) along the optical axis direction of the Cassegrain telescope (16), and after the light guide of the two-dimensional scanner (14), it passes through vertically The gla...

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Abstract

The invention relates to a Doppler laser radar detection system, in particular to a double-frequency Doppler laser radar detection system based on the single solid body FP etalon four-edge technology. The double-frequency Doppler laser radar detection system based on the single solid body FP etalon four-edge technology is characterized in that atmosphere backward scattering signals are collected through a Cassegrain telescope, pass through a fourth convex lens and a spike filter, and enter one end of a 200-meter-long bare optical-fiber patch cord through coupling, and the other end of the 200-meter-long bare optical-fiber patch cord is connected with a branch end of a second 1*2 optical fiber coupler. The beam-combining end of the second 1*2 optical fiber coupler is connected with the end a of an optical loop device, the reflecting light beam of a beam-splitting mirror enters a branch end of a first 1*2 optical fiber coupler, and the beam-combining end of the first 1*2 optical fiber coupler and the other branch end of the first 1*2 optical fiber coupler are connected with a 100-meter-long bare optical fiber and the other branch end of the second 1*2 optical fiber coupler respectively. By means of the technical scheme, the double-frequency Doppler laser radar detection system based on the single solid body FP etalon four-edge technology has the advantages that the signal to noise ratio is improved, the frequency discrimination capability of the reflected signals is sufficiently used, frequency discrimination sensitivity is improved, and therefore the wind speed measuring accuracy of the system is improved.

Description

technical field [0001] The invention relates to a Doppler laser radar measurement system, in particular to a dual-frequency Doppler laser radar measurement system based on a single solid FP etalon four-edge technology. Background technique [0002] Since the 1980s, direct detection Doppler lidar technology has developed rapidly, and two Doppler frequency detection technologies have emerged: edge technology and fringe imaging technology. Edge technology was first based on FP interferometer single edge technology. In 1998, Korb et al. developed the double-edge technology based on FP interferometer. In addition to using FP interferometer as a frequency discriminator, a method of using iodine molecular spectral lines for frequency discrimination was developed later. In 2001, Bruneau D proposed the use of Mach-Zehnder interferometer as a frequency discriminator of edge technology. The fringe imaging technology first uses the FP interferometer as a frequency discriminator. Sin...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S17/95G01S7/481G01P5/26G01P13/02
CPCG01P5/26G01P13/02G01S7/481G01S7/4814G01S17/95Y02A90/10
Inventor 沈法华
Owner YANCHENG TEACHERS UNIV
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