Digital-analog hybrid circuit built-in test device based on boundary scan

Abstract

The invention belongs to testability technologies, and relates to a digital-analog hybrid circuit BIT device based on boundary scan. The device is composed of a link scanning module, a boundary scan controller, a master controller, a test vector storage and a tested digital-analog hybrid circuit, the boundary scan controller and the master controller are needed in scan test execution, the test vector storage is loaded with test vectors, the device can achieve a BIT based on the boundary scan according to the characteristic of a digital-analog hybrid complex circuit, and therefore the test problem caused by the structure and cross link complexity of the digital-analog hybrid circuit can be effectively solved, and universal and reliable testability design is provided for the device. The fault detection and locating of the circuit can be facilitated, testing efficiency and reliability are improved, development and maintenance cost is lowered, and operational effectiveness and overall economic benefits are improved.

Description

Technical field [0001] The invention is a digital-analog hybrid circuit test device based on boundary scan, belonging to the technical field of testability. Background technique [0002] With the development and application of large-scale integrated circuits, the integration of digital-analog hybrid circuits is getting higher and higher, the structure is more compact, and the functions are becoming more and more complex. Especially for the digital-analog hybrid circuit, its circuit characteristics and the complexity of the cross-linking relationship getting bigger. This not only improves the circuit technical indicators, but also brings the diversification of failure modes, high coupling, high correlation, and the reduction of test accessibility, resulting in the test cost accounting for the total cost of the digital-analog hybrid circuit development. The ratio continues to rise, and the testability of digital-analog hybrid circuits has dropped sharply. Traditional testability d...

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Problems solved by technology

[0006] The present invention designs and provides a kind of digital-analog hybrid circuit machine-in-machine test device based on boundary scan just for above-mentioned prior art situation, and its purpose is to solve the present equipment BIT design to have poor fault diagnosis capability, high false alarm rate, and The problem of high cost, poor realizability and versatility of traditional in-machine test design optimization ideas

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