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A method for high acceleration stress screening of anti-skid brake control box

A high-acceleration stress and anti-skid braking technology, which is applied in the testing of machines/structural components, measuring devices, vibration testing, etc., can solve the problem of poor excitation of faults, and achieve the effect of saving resources and time

Inactive Publication Date: 2016-06-01
XIAN AVIATION BRAKE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0023] d) The vibration frequency is distributed in the frequency range of 10Hz to 10000Hz, suitable for HALT / HASS tests of components and printed plates. The weight of the anti-skid brake control box is between 2kg and 9kg, and the sensitive frequency is concentrated at 150Hz to 250Hz. In the low frequency area, therefore, for heavy anti-skid brake control boxes, the effect of stimulating faults is not as good as that of the three comprehensive experimental equipment;

Method used

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  • A method for high acceleration stress screening of anti-skid brake control box
  • A method for high acceleration stress screening of anti-skid brake control box
  • A method for high acceleration stress screening of anti-skid brake control box

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Effect test

Embodiment 1

[0098] In this embodiment, a high-acceleration stress screening test is carried out on the anti-skid brake control box of the first domestic regional aircraft braking system. Highly accelerated stress screening test profile, complete the verification of the effectiveness and safety of the highly accelerated stress screening test profile, and the verified high accelerated stress screening test profile can be implemented in production.

[0099] The specific steps of the test are:

[0100] Step 1. Determine the high temperature damage limit of the antiskid brake control box

[0101] The high-temperature damage limit of the anti-skid brake control box is determined by prior art. The high-temperature damage limit is used to determine the high-temperature temperature of the high-accelerated stress screening test section, and the temperature range of the high-temperature damage limit is 115° C. to 125° C. In this embodiment, 115° C. is used as the high-temperature damage limit.

[...

Embodiment 2

[0150] The processes of embodiment 2 and embodiment 3 all include testing the high-temperature damage limit of the anti-skid brake control box, adopting liquid nitrogen auxiliary temperature control to test the low-temperature damage limit of the anti-skid brake control box, and adopting sine frequency sweep and broadband to randomly test the damage limit of the anti-skid brake control box Hidden dangers of vibration failure, triggering the failure of the anti-skid brake control box under the condition of rapid temperature change, applying comprehensive environmental stress and working stress to stimulate the failure of the anti-skid brake control box, test and verification of the improved anti-skid brake control box, based on the high accelerated life test Data formulate the steps of the high-accelerated stress screening test profile, the validity verification of the high-acceleration stress screening test profile, and the safety verification of the high-acceleration stress scr...

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Abstract

The invention relates to an anti-sliding brake control box high-acceleration stress sieving method. Three comprehensive test devices are adopted, working currents are added into an anti-sliding brake control box in a test scheme, stoppage is stimulated under the common action of environment stress and the working currents and a more comprehensive improvement measure is obtained. The green effects of saving resources and time are achieved in developing the anti-sliding brake control box. By means of a high-acceleration stress sieving test profile of the anti-sliding control box, data formulating is achieved according to a high-acceleration service life test. A formulation principle is that stoppage of the anti-sliding brake control box is sieved without damaging the anti-sliding brake control box. Under the conditions, the high-acceleration stress sieving profile is composed of high temperature, low temperature, temperature vibration, vibration and the working currents. Effectiveness and safety of the test profile are verified and then the test profile can be applied to high-acceleration environment stress sieving in production to replace normal sieving in GJB1032 electronic product environment stress sieving.

Description

technical field [0001] The invention relates to the field of high-acceleration stress screening of transport aircraft electronic products, in particular to a method for high-acceleration stress screening of an aircraft anti-skid brake control box by using three comprehensive equipment. Background technique [0002] The high-accelerated stress screening technology for electronic products comes from the GMW8287 "Highly Accelerated Life, Highly Accelerated Stress Screening and Sampling Inspection" standard of General Motors Corporation of the United States, referred to as HASS, which is an advanced foreign electronic product screening method. Common Screening Method for Substitute Electronics, abbreviated as ESS. Common screening methods follow the MIL-STD-2164 "Electronic Equipment Environmental Stress Screening Method" standard. HASS is a special screening technology for electronic products. The screening technology of a product is only applicable to this type of product and...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M7/02
Inventor 乔建军刘劲松
Owner XIAN AVIATION BRAKE TECH
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