Device for measuring linear interval and face response characteristics of photoelectric detector

Abstract

The invention discloses a device for measuring the linear interval and the face response characteristics of a photoelectric detector. The device comprises a laser source, a first diaphragm, a laser power stabilizer, a laser power attenuator, a second diaphragm, a beam splitter prism, a first optical switch, a second optical switch, a first reflection mirror, a second reflection mirror, an integrating sphere, the photoelectric detector to be measured, an electrical signal amplifier, a data acquisition card, a computer and a thermostat. According to the device, the characteristic that the illumination of outgoing laser of the integrating sphere is even is mainly used, the advantages of being narrow in line width, stable in power and the like of the laser source are used, accurate measurement on the straightness and the face response evenness of different photoelectric detectors under the specific wave length can be achieved, and the device has the advantages of being rapid and convenient to use, large in dynamic range, high in interference resistance and the like. The repeated measurement accuracy of the device is higher than 0.05%.

Description

technical field [0001] The invention belongs to a detector characteristic parameter measuring and detecting device, in particular for measuring the straightness and surface response uniformity of a photoelectric detector. Background technique [0002] With the development and application of infrared detection technology, a series of infrared detectors with excellent performance have emerged. How to improve the measurement accuracy and objectively evaluate its technical performance, and provide reliable measurement guarantee for practical applications has attracted more and more attention. Linearity is an important characterization of photodetector performance, and linearity measurement is one of the basic issues in metrology research. Most sensors and measurement systems have linearity problems. In general, the calibration of a sensor or measuring instrument can only be performed at a limited point. For other areas other than the calibration point, it can only be calculated ...

AI Technical Summary

Problems solved by technology

However, in practice, the manufacturers do not provide the response uniformity of the large-area detector surface. At the same time, due to the large difference in detector parameters, it is difficult to find a suitable photodetector straightness measuring instrument on the market. A large device for measuring the straightness of the detector and the uniformity of the surface response to measure the characteristic parameters of various photodetectors

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