Electromagnetic scattering analysis method for metal complex inhomogeneous medium mixed target

A hybrid target, electromagnetic scattering technology, applied in special data processing applications, electrical digital data processing, instruments, etc., can solve the problems of large unknowns and high consumption of computing resources, reducing computing time, computing memory, and speeding up the solution speed. Effect

Active Publication Date: 2013-12-04
NANJING UNIV OF SCI & TECH
View PDF1 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Due to the volume subdivision of complex heterogeneous media, the unknown quantity is huge. shaped FSS using hybrid VSIE combined with parallelized MLFMM. ICMMT 2010, Chengdu, 614–616.) Accelerated method of moments is still faced with the problem of high consumption of computing resources

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electromagnetic scattering analysis method for metal complex inhomogeneous medium mixed target
  • Electromagnetic scattering analysis method for metal complex inhomogeneous medium mixed target
  • Electromagnetic scattering analysis method for metal complex inhomogeneous medium mixed target

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and understandable, the specific implementation modes of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the above-mentioned and other purposes, features and advantages of the present invention will be clearer.

[0026] figure 1 It is a schematic diagram of the Ewald sphere in the electromagnetic scattering analysis method applied to the metal complex heterogeneous medium mixed target of the present invention, figure 2 It is a schematic diagram of the angular spectrum components corresponding to the multilayer fast multipole of the electromagnetic scattering analysis method applied to the metal complex heterogeneous medium mixed target of the present invention, image 3 It is a schematic diagram of the angular spectrum components corresponding to the ray multipoles of the electromagnetic scattering a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an electromagnetic scattering analysis method for a metal complex inhomogeneous medium mixed target. According to scattering properties of a mixed structure, a total electric field on the target is equal to the sum of an incident field and a scattered field, a uniform plane wave is usually used as the incident electric field, and the scattered electric field can be expressed by the aid of the electric flux density and the induced current density to be solved. A green function in a free space is expanded based on the addition theorem, and specific expression forms of aggregation factors, transfer factors and configuration factors of a far-field portion are given. According to characteristics of a body-surface integral equation and by the aid of the ray-tracing basic principle, portions with large angular spectral components in the transfer factors are reasonably selected, and portions with small angular spectral components are abandoned. Far-field effects are calculated by the aid of a fast far-field approximation method on a higher layer; a matrix equation is solved, and electromagnetic scattering parameters are calculated. The scattering problem of the metal complex inhomogeneous medium mixed target is solved by the aid of less computational memory and computational time.

Description

technical field [0001] The invention belongs to the technical field of rapid calculation of electromagnetic scattering characteristics of targets, and in particular relates to an electromagnetic scattering analysis method applied to mixed targets of metal complex heterogeneous media. Background technique [0002] As more and more objects mixed with metal complex heterogeneous media appear in practical applications, it is extremely important to propose an accurate and effective electromagnetic analysis method. In the field of computational electromagnetics, some numerical calculation methods to solve the electromagnetic scattering characteristics of such structures have also emerged. [0003] For this kind of metal-medium hybrid structure, the metal part is usually treated as a perfect electrical conductor (PEC), and it is easy to analyze and solve it by the surface integral equation method (SIE), where the RWG basis function (Rao M, Wilton D and Glisson A. Electromagnetic s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F19/00
Inventor 陈如山丁大志樊振宏陶诗飞
Owner NANJING UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap