Device and method for double-pulse test of IGBT (insulated polar bipolar transistor) driving module
A technology of driving modules and testing devices, which is applied in the direction of electronic circuit testing, etc., can solve the problems that the double-pulse test platform is difficult to meet the factory test of mass production, cannot obtain accurate test data, and burns the electric vehicle controller. Damage to electronic components or controllers, improved test efficiency, simple and quick operation
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[0046] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following description.
[0047] A double-pulse test device for an IGBT drive module, which includes an analog controller, an oscilloscope, a high-voltage power supply and a load inductance (L). The oscilloscope, high-voltage power supply and load inductance are integrated in a double-pulse test cabinet, and the analog controller is integrated with a test Main board (CPU), the test main board is connected to the power unit under test, the test main board is responsible for generating pulse width modulation signal (PWM), controlling the power unit under test to turn on and off, measuring the phase of IGBT and controlling the phase line to output the corresponding signal. The positive pole of the high-voltage power supply is connected to the positive bus wire of the an...
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