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Object defect check system and method

A defect detection, article technology, applied in the direction of measuring devices, material analysis by optical means, instruments, etc.

Inactive Publication Date: 2013-10-30
VITROX CORP BERHAD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The limitation of this invention is that it requires more time and additional equipment to analyze the dark and bright parts of the captured image of the object under test

Method used

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  • Object defect check system and method
  • Object defect check system and method

Examples

Experimental program
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Embodiment Construction

[0015] The present invention discloses a defect detection system 100 for an item 102, which includes a light source 101 generally located on the side of the item 102 and used to project light to illuminate part of the item 102; a platform 103 for supporting the item 102; an optical sensor 105; and a reflection device 104 arranged between the light source 101 and the object 102, inclined to the light source 101 at a certain angle, used to receive the light image reflected from the illuminated part of the object, and project the light image to the light sensor 105 On; there, the light sensor 105 will record the reflected light image, and convert the light image into data for defect analysis.

[0016] An LED lens, preferably of dome shape, is an item of interest 102 for testing its light transmission and / or sensory quality. Defects on the lens surface or inside of an LED lamp affect both its performance and its aesthetic value. Defects on or within the object 102 include any one...

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PUM

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Abstract

The invention discloses an object defect check system (100) that comprises a light source (101) roughly on a lateral side of an object (102) for projecting light so as to illuminate partial object (102); a platform (103) to support the object (102); a light sensor (105); and a reflection apparatus (104) that is arranged between the light source (101) and the object (102) and is inclined to the light source (101) in a certain angle so as to receive a light image reflected by the illuminated part of the object and project the light image onto the light sensor (105), and then the light sensor (105) records the reflected light image and converts the light image into data for defect analysis. The invention can check defects of the surface and internal object effectively.

Description

technical field [0001] The invention relates to an item defect detection system and method. In particular, the present invention relates to a system and method for detecting defects such as bubbles, scratches, air gaps, stains and pits on or within LED lenses. Background technique [0002] During the production and use of an item, various defects may occur on its surface and inside, such as bubbles, air gaps, cracks, scratches, dents, fingerprints and stains. Often, these defects are small in size or buried deep inside the item, making them difficult to spot with the naked eye without the aid of instrumentation. Such defects can destroy the quality of transparent objects and affect their performance. For example, scratches, air bubbles, or dust contamination on the surface or inside of the LED lens will scatter the light passing through the lens, resulting in a decrease in contrast. Diffraction patterns can also be affected due to obstruction by broken lenses. [0003] I...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/958
Inventor 李建惠
Owner VITROX CORP BERHAD
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