Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Full-automatic electrically-controlled microscope sample bench

A sample stage and microscope technology, applied in the field of fully automatic electronically controlled microscope sample stage, can solve problems such as low experimental efficiency and inability to eliminate random errors, and achieve the effects of high experimental efficiency, increased sample load, and less space occupied

Inactive Publication Date: 2013-10-16
陈松
View PDF8 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The actual technical problem to be solved in the present invention is: one optical microscope used by traditional researchers can only take one sample, the experimental efficiency is low, and the random error of different batches of experiments cannot be eliminated to ensure the accuracy of the experimental results

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Full-automatic electrically-controlled microscope sample bench
  • Full-automatic electrically-controlled microscope sample bench
  • Full-automatic electrically-controlled microscope sample bench

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments.

[0027] see figure 1 , the fully automatic electronically controlled microscope 100 sample stage 300 of the present invention mainly includes several microscopes 100, an electronically controlled translation stage 200, a sample stage 300, a driving device 400, a switching power supply and a control host 500.

[0028] Wherein, the data of the microscope 100 can be selected according to actual needs, which is not limited in the present invention. All the microscopes 100 are evenly distributed on the same horizontal line to ensure the level stability of the electronically controlled translation stage 200 when driving it to move. combine figure 2 , the main body of the sample stage 300 is a strip metal, which is arranged laterally on the stage of th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Disclosed in the invention is a full-automatic electrically-controlled microscope sample bench. The bench is characterized in that the bench comprises a plurality of microscopes, an electrically-controlled translation stand, a sample stand, a driving device, a switching power supply, and a controlling host. The plurality of microscopes are uniformly distributed at the same horizontal line. The sample stand is arranged at objective tables of the microscopes and includes a plurality of grooves for placing sample culture dishes; and one end of the sample stand is connected with the electrically-controlled translation stand. The electrically-controlled translation stand includes a sliding rail and a sliding plate arranged at the sliding rail; and the sliding plate is connected with the sample stand and can drive the sample stand to move. The driving device is connected with the switching power supply and is powered by the switching power supply; and the driving device is also connected with the controlling host by a data acquisition card; and the data acquisition card is used for converting a control signal from the controlling host into an electric pulse signal and sending the converted signal to the driving device. And control software is installed inside the controlling host and is used for controlling the motion of the electrically-controlled translation stand and collecting microscope information.

Description

technical field [0001] The invention relates to the field of laboratory equipment, in particular to a fully automatic electronically controlled microscope sample stage. Background technique [0002] As we all know, in many universities or research institutes, the optical microscopes used by researchers can only take one sample. However, in many experiments, especially in biological experiments, the experiment requires many samples under different artificially controlled experimental conditions to be photographed at the same time. the accuracy of the results. The general practice is to solve the above problems by purchasing a large number of microscopes, but this will not only waste a lot of scientific research costs, but also have high requirements for the size of the laboratory and the number of operators. [0003] At present, there is a solution to the above problems by building a rotary sample stage, but the disadvantage of this solution is that the samples that can be ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G02B21/34G02B21/32G01N21/01
Inventor 陈松陈唯
Owner 陈松
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com