Junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum

Abstract

The invention discloses a junction temperature testing device and a junction temperature testing method based on the temperature variation of LED (light-emitting diode) relative spectrum, belonging to the field of LED photoelectric detection. The junction temperature testing device based on the temperature variation of the LED relative spectrum comprises a driving power supply, a thermostat, an integrating sphere and a spectrum analyzer; based on the principle of correlation between LED junction temperature and the relative spectrum, on the one hand, the temperature of an LED to be tested is controlled through the thermostat, and the LED to be tested is driven to illuminate by using small current; and on the other hand, the relative spectrum of the LED to be tested is collected through the spectrum analyzer, the relation formula of junction temperature characterization parameter and LED junction temperature is obtained through fitting by adopting the area formed by enclosing of the relative spectrum under different temperatures and a reference relative spectrum as the junction temperature characterization parameter. The invention aims at providing the accurate, reliable, convenient, simple, practical and low-price LED junction temperature testing device and the LED junction temperature testing method.

Description

technical field [0001] The present invention relates to an LED junction temperature testing device and its method, more specifically, to a junction temperature testing device and its method based on the change of LED relative spectrum with temperature. Background technique [0002] LED (light emitting diode) has many advantages such as small size, long life, high brightness, energy saving and environmental protection, etc. It is considered to be the most potential fourth-generation lighting source, and has been widely used in signal indication, display and general lighting and other fields. The photoelectric color characteristics of the LED itself are closely related to the temperature. As the junction temperature increases, the luminous efficiency of the LED decreases and the life span is shortened. Therefore, it is of great significance to quickly, scientifically and conveniently measure the LED junction temperature, especially the junction temperature of the packaged LED ...

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to overcome the existing junction temperature measurement method, which is difficult to achieve unification of accuracy and convenience, and difficult to measure, to provide a junction temperature test device and method based on LED relative spectrum changes with temperature, using The technical solution provided by the invention not only can make the measurement of LED junction temperature more accurate, reliable and convenient, but also has the characteristics of simplicity, practicality and low cost

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