Transmission electron microscope objective lens diaphragm
An electron microscope and objective lens technology, applied in circuits, discharge tubes, electrical components, etc., can solve the problems of reducing the signal-to-noise ratio and resolution of high-resolution images of transmission electron microscopes, and achieve full and full images, improve image resolution, and improve image quality. Effects of Noise Ratio and Resolution
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[0015] The specific implementation of the transmission electron microscope objective diaphragm provided by the present invention will be described in detail below in conjunction with the accompanying drawings.
[0016] attached image 3 Shown is a transmission electron microscope objective diaphragm manufactured by focused ion beam (FIB) nanofabrication technology, which is made of Mo or other alloys, including a diaphragm plate 31, a threaded rod 32 and a handle 33, three C-shaped openings 311, 312 and 313 are arranged successively on the axis of the aperture plate 31, and the outer diameter of the opening is 100-200 microns, to ensure the maximum width of the diffraction spectrum exceeding the rear focal plane of the transmission electron microscope; the inner diameter of the opening (the so-called inner diameter refers to the aperture The diameter of the plate head) can be varied from 10 nm to 100 µm to ensure a diameter larger than the transmission spot. The same aperture...
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