Electronic load module of power supply aging test and power supply aging test system

Abstract

The invention provides an electronic load module of a power supply aging test and a power supply aging test system. The electronic load module of the power supply aging test provides an intelligent electronic load module controlled by an MCU (Microprogrammed Control Unit). According to the power supply aging test system, a plurality of electronic load modules of the power supply aging test are uniformly managed, displayed and stored by adopting an upper computer, so that the system is the intelligent power supply aging test system.

Description

technical field [0001] The invention relates to the field of electronic loads in power supply aging test equipment, in particular to a programmable electronic load module used for switching power supply aging tests and aging test systems such as aging vehicles and aging rooms composed of many such electronic load modules. Background technique [0002] In order to test and improve the reliability, stability and safety of power supply products, the aging test of power supply products has become an important link in the production process of such products. The so-called "burn-in" refers to a long-term full-load test (also called burn-in test or burn-in, English name: Burn-in Test) of power supply products under a harsh high-temperature condition to simulate possible occurrences in actual use. harsh conditions to test the performance of the product. [0003] The dummy load used in traditional burn-in test equipment is mostly high-power resistors, which is the first generation o...

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Problems solved by technology

[0004] ① The resistance value of the resistor is fixed, and there are few optional specifications, many of which need to be customized from the factory;

[0005] ② The power supply specifications are various, and the resistance cannot be accurately matched to the accurate current required for aging;

[0006] ③ The resistance error is large, and it is easy to produce deviation after temperature rise, which cannot ensure 100% load aging of the product;

[0007] ④ Adjusting the load size needs to be calculated first, and the selection of load resistance can only obtain an approximate current value;

[0008] ⑤ The aging process cannot be automatically monitored, and manual inspections are required one by one, which is inefficient and easy to miss;

[0009] ⑥ It is impossible to record the parameters of the aging process, which is not convenient for quality traceability management;

[0010] ⑦ The aging report cannot be generated, which is not convenient for the analysis and evaluation of product quality;

The second-generation load overcomes the first three shortcomings of the first-generation load, but the latter four shortcomings are still prominent and cannot meet the needs of modern production processes

Although there are many standard test electronic load instruments on the market that can fully meet the aging requirements in terms of performance and functions, such instruments are usually expensive, bulky, and are mainly designed for R&D, engineering, production and other testing purposes, which is difficult to achieve. System networking with hundreds of channels for mass aging

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