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A method for constructing a test meter, a method for measuring electromagnetic characteristics and its device

A technology of electromagnetic properties and structure, applied in the field of metamaterials, can solve problems such as lack of information, and achieve a spatially representative effect

Active Publication Date: 2016-03-09
KUANG CHI INST OF ADVANCED TECH
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Problems solved by technology

The "Lo.t0 orthogonal design method" widely used in this field can arrange multi-factor experiments, but its inherent experimental table construction method limits the uniform dispersion of test points to a certain extent, so in some specific areas, there will be There is a lack of information caused by insufficient number of experimental points

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  • A method for constructing a test meter, a method for measuring electromagnetic characteristics and its device

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Embodiment Construction

[0036] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0037] image 3 It is a flowchart of an embodiment of the method for measuring the electromagnetic properties of the artificial electromagnetic material structural unit of the present invention, as image 3 As shown, the method includes the following steps:

[0038] Step 301: According to the number s of test influencing factors and the number of levels q of each factor, determine the number of rows q of the orthogonal test table 2 and the number of columns s. The so-called test influencing factors are the parameters that affect a certain test. The different states or contents of a factor are called levels, and the so-called level number of a factor is the corresponding value level number within a reasonable parameter value range. For example, in the test, temperature is used as a factor, and 100°C, 110°C, and 120°C are three levels of temperature...

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Abstract

The invention discloses a method of constructing a test table, and a method and a device of measuring an electromagnetic property. The method comprises confirming the number of rows and columns of an orthogonal table according to influencing factors and the number of levels of the factors, adopting an orthogonal design method to construct the content of first two lists of the orthogonal table, defining a matrix L1 formed by the content, adopting a uniform design method to construct the content of a uniform design table with smallest deviation, adopting a clockwise rotation method to construct the content of the uniform design table with the smallest deviation to be a matrix L2 matched with the L1, combining the content of the matrix L1 and the matrix L2 to completing the construction of an orthogonal table of multiple factors, carrying out simulation measurement on each test point of artificial electromagnetic materials constructed according to the orthogonal table of multiple factors, and obtaining electromagnetic property data of electromagnetic material structural units. Through the mentioned mode, the method of constructing the test table and the method and the device of measuring the electromagnetic property can use fewer test times to the greatest extent, meanwhile guarantee the selected test points to be distributed evenly, and have better spatial representativeness.

Description

technical field [0001] The invention relates to a technical field of metamaterials, in particular to a method for constructing a multi-factor orthogonal test table based on a uniform test design, a method for measuring electromagnetic properties of a structural unit of an artificial electromagnetic material and a device thereof. Background technique [0002] Measuring the electromagnetic properties of the structural units of artificial electromagnetic materials is an important link in the design process of artificial electromagnetic materials. How to select a certain size of artificial electromagnetic material structure unit for electromagnetic simulation measurement is a problem that must be solved in the whole design process. [0003] Corresponding to a single microstructure unit, its geometric shape information is described by a set of parameters, and the value of the parameter represents the size of the shape. Within a reasonable range of parameter values, each paramete...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 刘若鹏季春霖刘斌易翔
Owner KUANG CHI INST OF ADVANCED TECH
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