Method for measuring posture and height of dynamic platform
A technology of height measurement and dynamic platform, which is applied in the direction of measuring device, line-of-sight measurement, and distance measurement, etc. It can solve the problems of long preparation time, decreased measurement accuracy, limited attitude measurement accuracy, and receiver baseline length.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0034] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0035] figure 1 It is a schematic diagram of the principle of the dynamic platform attitude and height measurement method, showing the definition of the scanner system coordinate system and the equipment installation method. The X-Y-Z coordinate system is the scanner system coordinate system X S-scaner , the origin is the intersection O of the scanning planes of the two scanners and the three planes where the platform is located, the X axis is parallel to the plane where the platform is located but perpendicular to the advancing direction of the platform, the Y axis is parallel to the plane where the platform is located and is opposite to the advancing direction of the platform, Z The axis is perpendicular to the plane where the platform is located and the upward direction is positive, and the X-axis, Y-axis and Z-axis form a right-handed coordinate system; t...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com