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Light source spectrum modulating device

A spectrum modulation and light source technology, applied in the field of optical testing, can solve problems such as lack of means, inability to fully control the output spectrum intensity, and large differences in spectral distribution

Active Publication Date: 2013-04-03
BEIJING ZHENXING METROLOGY & TEST INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This technology improves how we produce lights that have specific colors or patterns on their surface by adjusting its color temperature (CCT) based on factors like ambient brightness levels at different times during use. It also allows us to create unique spectra from these colored lights which are used for various purposes such as optics-based measurements and simulations.

Problems solved by technology

This patented technical problem addressed by this patents relates to accurately measuring various important factors like spectra distributions, space distribution, etc., during optics calibration/simulation testing without requiring separate measurements from each other. Current methods require complete control over both spectral properties (spectrum) and spatial dimensions but these techniques have limitations due to their dependence upon specific types of light sources used together.

Method used

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Embodiment Construction

[0022] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, for purposes of explanation and not limitation, specific details are set forth in order to provide a thorough understanding of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details.

[0023] It should be noted here that, in order to avoid obscuring the present invention due to unnecessary details, only the device structure and / or processing steps closely related to the solution according to the present invention are shown in the drawings, and the steps related to the present invention are omitted. Invent other details that don't really matter.

[0024] Embodiments of the present invention will be described below with reference to the drawings.

[0025] like figure 1 Shown is a schematic struct...

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Abstract

The invention provides a light source spectrum modulating device. The light source spectrum modulating device comprises a light source, a first collecting optical unit, a chromatic dispersion unit, a digital micromirror array, a second collecting optical unit and a light uniformly blending unit, wherein the first collecting optical unit is used for collecting the light irradiation of the light source; the chromatic dispersion unit is used for chromatically dispersing the light irradiation collected by the first collecting optical unit, and imaging; a digital micromirror array is formed on a focal surface of the chromatic dispersion unit and is used for controlling the overturning state of each micromirror in order to select different spectrum positions and spectrum bandwidths; the second collecting optical unit is used for collecting the light irradiation reflected by the digital micromirror array again and transferring the collected light irradiation into the light uniformly blending unit; and the light uniformly blending unit is used for blending and recombining the separated single-light irradiation. By adopting the light source spectrum modulating device, the light source spectrum can be distributed again, and the distribution characteristic of the light source spectrum can be changed; the light source spectrum modulating device can be applied to the field of calibrating of optical instruments and simulation test; and by adopting the technology provided by the invention, the calibrating precision of the optical instruments and the simulation test capacity can be improved.

Description

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Claims

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Application Information

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Owner BEIJING ZHENXING METROLOGY & TEST INST
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