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BIT (Built-In Test) circuit of multipath ground/open discrete magnitude input signal

A technology of input signal and test circuit, which is applied in the field of BIT test circuit, can solve the problems of high measurement cost, poor test result reliability, long test cycle, etc., and achieve the effect of simple circuit, improved testability and reliability

Active Publication Date: 2012-12-12
AVIC NO 631 RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The invention provides a BIT test circuit for multi-channel ground / open discrete input signals, which mainly solves the problems of long test period, high measurement cost and poor reliability of test results in the prior art

Method used

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  • BIT (Built-In Test) circuit of multipath ground/open discrete magnitude input signal

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Embodiment Construction

[0015] Principle of the present invention and structure are described in detail below in conjunction with specific embodiment, as figure 1 Shown:

[0016] The BIT test circuit for multi-channel ground / open discrete input signals includes at least two second-order filter circuits, buffer circuits and drive circuits connected in series in sequence. One end of the second-order filter circuit is a discrete input end, and the other end is a data output end. The buffer circuit and the driving circuit are also connected with the decoding control circuit used for controlling data transmission and instruction decoding, and the wire before the second-order filtering of the second-order filter circuit is provided with a first connection point, and the first connection point is connected with a second connection point. A relay K1 and a resistor R1, the first relay K1 includes two gears, one gear is the pull power supply, the other gear is the analog ground terminal AGND; after the second-...

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Abstract

The invention provides a BIT (Built-In Test) circuit of a multipath ground / open discrete magnitude input signal, which is mainly used for solving the problems of long test cycle, high measurement cost and poor reliability of test result in prior art. The BIT circuit of a multipath ground / open discrete magnitude input signal comprises at least two paths of serially connected second order filter circuits, a buffer circuit and a drive circuit, wherein one end of the second order filter circuit is a discrete magnitude input end while the other end thereof is a data output end, and the buffer circuit and the drive circuit are further connected with a decoding control circuit which is used for controlling data transmission and instruction decoding. The BIT circuit of a multipath ground / open discrete magnitude input signal only additionally adds two combined relays in hundreds of normal signal processing circuits, so that circuits are simple, practical and reliable, and the testability and the reliability of the circuits are improved greatly.

Description

technical field [0001] The invention relates to a BIT test circuit for multiple ground / on discrete input signals, which is used for processing the discrete signals. Background technique [0002] In computer discrete input circuits, there are nearly a hundred independent discrete input channels of the ground / open type, and discrete signal processing circuits generally include input isolation circuits, EMI (electromagnetic compatibility) circuits, level conversion circuits, buffer drive circuits, decoding Control circuit, BIT (self-test) support circuit and other components. [0003] The number of ground / open discrete independent input channels is large, and the normal signal processing circuit is very complicated. When using the existing test method to test it, the test mechanism itself is relatively complicated, the test cost is high, and the test period is long. And the reliability is poor; therefore, there is an urgent need to provide a well-tested, simple and practical B...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 曹兴冈彭刚锋孙允明赵刚解启水
Owner AVIC NO 631 RES INST
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