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Bi-linear CCD-based strip width measurement method and system

A technology of width measurement and double linear array, which is applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems of inability to overcome the influence of strip measurement, inability to overcome the influence of strip, cumbersome calibration process, etc., and achieve easy maintenance and Debugging, strong anti-vibration interference ability, good stability

Active Publication Date: 2015-06-03
XIAN UNIV OF TECH
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Problems solved by technology

However, this solution cannot overcome the influence of the vibration of the strip on the measurement
There is also a measurement method using dual CCD cameras. One CCD camera is installed on each of the two edges of the strip. Through the calibrated measurement system, the relative position change of each edge in the corresponding CCD camera is calculated to achieve width measurement. The early stage of this scheme The calibration process is cumbersome and cannot overcome the influence of the vibration of the strip on the measurement
Therefore, there are disadvantages of vibration interference in high-speed production lines, which has become a bottleneck restricting the development of strip production-related industries

Method used

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  • Bi-linear CCD-based strip width measurement method and system
  • Bi-linear CCD-based strip width measurement method and system
  • Bi-linear CCD-based strip width measurement method and system

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Embodiment Construction

[0023] Such as figure 1 As shown, the present invention is based on the strip width measuring system of double linear array CCD, comprises the linear light source 1 that is arranged under the strip 2 to be measured, and the left side CCD detection sensor 3 and the right side CCD detection sensor 3 are arranged at intervals above the strip 2 to be measured. Side CCD detection sensor 8. The connection line between the left side CCD detection sensor 3 and the right side CCD detection sensor 8 is parallel to the strip 2 and the light source 1 .

[0024] The light source 1 is a linear array composed of multiple infrared diodes with a wavelength of 700nm-900nm, and has the characteristics of long service life and easy installation. The left side CCD detection sensor 3 and the right side CCD detection sensor 8 are used to obtain the imaging plane information of the strip 2 under the illumination of the light source 1, such as figure 2 As shown, left side CCD detection sensor 3 and...

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Abstract

The invention discloses a bi-linear CCD-based strip width measurement method. A method of perceiving a distance using two eyes by humans is imitated. Y axis coordinates of both end points of the strip are obtained through a parallax of both ends of the strip obtained by left and right two CCD sensors. X axis coordinates of the both end points of the strip are further obtained on the basis of the geometric characteristics. The strip width measurement problem is then turned into the problem of the distance between two points in space and the strip width is thus obtained. The invention further discloses a measurement system for implementing the method. With the method of the invention, the width measurement of the strip on a high-speed production line is not subject to vibration interference and the measurement has high accuracy.

Description

technical field [0001] The invention belongs to the technical field of non-contact measurement methods for machine vision, and in particular relates to a method for measuring the width of a strip based on a double-line array CCD, and in particular to a system for measuring the width of a strip based on a double-line array CCD. Background technique [0002] Strip is a strip of metallic material supplied in rolls with a large aspect ratio. A strip with a width greater than 600mm is called a wide strip; a strip with a width less than 600mm is called a narrow strip. With the increasing development of modern industry, the measurement of strip width is an important problem that needs to be solved in modern industrial production. Yield, stable product quality. [0003] In the non-contact measurement technology based on machine vision, the more mature application scheme is to use a single linear array CCD. The principle is that the light source emits parallel visible light and ill...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/03
Inventor 杨延西张伟刚
Owner XIAN UNIV OF TECH
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