Fault diagnostic method and diagnostic device of sensor
A technology of sensor faults and diagnostic methods, applied in the direction of instruments, etc., can solve problems such as the inability to express the time-frequency local properties of signals
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0043] In this embodiment, the wavelet packet transform and the neural network are combined to diagnose the sudden fault of the sensor. The wavelet packet can be regarded as an extension of the step-by-step orthogonal division of the function space, and inherits the characteristics of the corresponding wavelet function. Wavelet packet analysis can provide a more refined analysis method for the signal. It divides the frequency band into multiple levels, performs the same further decomposition on the high-frequency part of the signal as the low-frequency part, and can adaptively analyze the signal according to the characteristics of the analyzed signal. The corresponding frequency band is selected to match the signal spectrum, thereby improving the time-frequency resolution. Each decomposition is equivalent to performing low-frequency and high-frequency filtering at the same time, further decomposing the low-frequency and high-frequency parts, and so on, so that the low-frequenc...
Embodiment 2
[0095] image 3 It is a schematic diagram of the device in Example 2 of the present invention. This embodiment provides a sensor fault diagnosis device, including:
[0096] a signal receiving unit 301, configured to receive the output signal of the sensor;
[0097] A wavelet packet decomposing unit 302, configured to decompose the output signal using a wavelet packet;
[0098] A wavelet packet transform coefficient screening unit 303, configured to filter out the wavelet packet transform coefficient with the largest magnitude, so as to retain data that can characterize fault characteristics;
[0099] A feature vector extraction unit 304, configured to perform feature extraction according to the rate of change of energy of each frequency component of the sensor, to obtain a feature vector;
[0100] The neural network judging unit 305 is used to input the feature vector into the designated neural network to obtain the sensor fault type, wherein the number of input and output ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com