Method for rapidly and accurately correcting frame influence for transient electromagnetic data
A technology of transient electromagnetic, correction method, applied in the field of geophysical exploration
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[0046] (1) According to field measured data , using the late apparent resistivity calculation formula of the central loop
[0047]
[0048] Calculate the corresponding apparent resistivity of each point, where Heng / m, S T is the sending loop area, S R is the receiving coil area, t is the measurement time, For the normalized induced EMF is the transient value, is the apparent resistivity, and π is the circumference ratio;
[0049] (2), according to the skin depth estimation formula
[0050]
[0051] Calculate the corresponding apparent depth, where, is the apparent depth, is an empirical parameter, is the apparent resistivity, is the measurement time;
[0052] (3) Construct the "thickness-resistivity" forward modeling model through the corresponding apparent depth-late apparent resistivity relationship;
[0053] (4) According to the given model in step 3, pass
[0054]
[0055] Calculate the frequency-domain electromagnetic field between the center ...
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