Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System for testing optical thin film damage threshold

A technology of optical film and test system, which is applied in the direction of testing optical properties, can solve problems such as large measurement errors, and achieve the effects of wide application range, accurate measurement, and accurate data results

Inactive Publication Date: 2012-07-18
BEIJING GK LASER TECH
View PDF4 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the technical problem of large measurement errors in the prior art laser parameter measurement system, the present invention provides a test system for optical film damage threshold with accurate measurement results and easy installation and adjustment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System for testing optical thin film damage threshold
  • System for testing optical thin film damage threshold

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The present invention relates to a test system for the damage threshold of optical thin films, which includes a pulsed laser 100, an attenuation plate 101, a total reflection lens group 102, a converging lens 103, a window mirror 104, a beam splitter mirror 105, a total Mirror 106, an energy meter 107, a first image acquisition device 108, a second image acquisition device 109, a photoelectric probe 110, an oscilloscope (not shown), a data processing device (not shown), a carrier Object stage 111 and a rotating stage 112. The pulsed laser 100, the attenuation sheet 101, the total reflection lens group 102, the converging lens 103, the window mirror 104, the beam splitter 105 and the total reflection mirror 106 are sequentially arranged along the optical path . The energy meter 107, the first image acquisition device 108, the second image acquisition device 109, and the oscilloscope are all connected to the data processing device.

[0020] The pulsed laser 100 is used ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a system for testing optical thin film damage threshold. The system comprises a pulse laser, an attenuator, a converging lens, a window mirror, a beam splitting mirror, a total reflection mirror, an energy meter, a first image collecting device and a second image collecting device, wherein light beams emitted from the laser transmit to the converging lens after attenuation by the attenuator, the light beams converged by the converging lens sequentially pass through the window mirror and the beam splitting mirror for transmission and are reflected by the total reflection mirror and then enter into the optical thin film to be tested, the light beams reflected by the window mirror enter into the first image collecting device, the light beams reflected by the beam splitting mirror enter into the energy meter, and the second image collecting device collects image information on the surface of the optical thin film to be tested. The system for testing optical thin film damage threshold is accurate in testing result, easy to install and adjust, and wide in application.

Description

technical field [0001] The invention relates to a test system for optical components, in particular to a test system for the damage threshold of an optical film. Background technique [0002] The continuous development of laser technology makes it widely used in various fields. Accurately grasping the laser-induced damage threshold of optical thin films is particularly important for researchers and engineers in the field of intense laser research. Because there are many factors affecting laser damage, it involves a wide range of areas, and the damage mechanism is also very complicated. Therefore, high-power laser-induced optical film damage is still a hot spot that many researchers at home and abroad pay attention to. [0003] Accurate measurement of the damage threshold of laser optical thin films is a necessary condition for the study of optical components with high resistance to laser damage. The damage threshold of optical thin films is a key parameter of the thin film...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 樊仲维朱光
Owner BEIJING GK LASER TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products