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Metal oxide semi-conductor image sensor

A technology of oxide semiconductors and image sensors, applied in the field of image sensors, can solve the problems of complex control logic, small fill factor of image sensors, complex circuits, etc., and achieve the expansion of dynamic range, improvement of dynamic range, simple circuit structure and logic control Effect

Active Publication Date: 2014-02-26
河北苏格医疗科技有限公司
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0009] Dual-mode CMOS image sensors usually include C-APS and PPS two readout methods, but the inventors of the present invention have found that the dual-mode CMOS image sensors in the prior art either have complex circuits, resulting in a relatively small fill factor of the image sensor, or Control logic is too complex

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Embodiment Construction

[0045] In the following description, many technical details are proposed in order to enable readers to better understand the application. However, those skilled in the art can understand that without these technical details and various changes and modifications based on the following implementation modes, the technical solution claimed in each claim of the present application can be realized.

[0046] In order to make the purpose, technical solution and advantages of the present invention clearer, the following will further describe the implementation of the present invention in detail in conjunction with the accompanying drawings.

[0047] A first embodiment of the present invention relates to a metal oxide semiconductor image sensor. Figure 4 is a circuit configuration diagram of the metal oxide semiconductor image sensor.

[0048] Specifically, as Figure 4 As shown, the metal oxide semiconductor image sensor includes: a photodiode PD, a first MOS transistor PPS, a secon...

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Abstract

The invention relates to the field of image sensors and discloses a metal oxide semi-conductor image sensor. According to the invention, the function of bimodule reading is realized through the structure of the metal oxide semi-conductor image sensor, the dynamic range of the image sensor can be expanded effectively, and both the circuit structure and the logic control are simpler. Through related double sampling, noise can be reduced effectively, and S / N ratio of readout signals can be improved greatly. Under the condition of stronger ambient light, reading is performed in a PPS (Passive Pixel Sensor) mode, and electric charge is read directly without magnification, so that the circumstance of saturation of C-APS (Active Pixel Sensor) due to excessively strong light can be avoided, however, under the condition of poor ambient light, reading is performed in a C-APS (Active Pixel Sensor) mode, and variable gain reading is realized through different offsets, therefore, the dynamic range of the metal oxide semi-conductor image sensor can be expanded greatly.

Description

technical field [0001] The invention relates to the field of image sensors, in particular to dual-mode metal oxide semiconductor image sensor technology. Background technique [0002] As we all know, an image sensor is a semiconductor device that converts an optical image into an electrical signal. Image sensors can be roughly classified into charge-coupled device (Charge-Coupled Device, “CCD” for short) and complementary metal oxide semiconductor (Complementary Metal Oxide Semiconductor, “CMOS” for short) image sensors. [0003] Existing CMOS image sensors can be roughly divided into passive pixel sensors (Passive Pixel Sensor, referred to as "PPS"), active pixel sensors (Active Pixel Sensor, referred to as "APS") and digital pixel sensors according to their readout methods. (Digital Pixel Sensor, referred to as "DPS") three types. [0004] PPS is also known as a passive pixel sensor, which consists of a reverse biased photodiode and a switch tube. A photodiode is essent...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/374H04N5/3745H04N5/378
Inventor 孙涛汪辉陈杰方娜田犁
Owner 河北苏格医疗科技有限公司
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