Method for forecasting service life of intermediate frequency log amplifier based on failure physics

Abstract

The invention relates to a method for forecasting the service life of an intermediate frequency log amplifier based on failure physics. The method comprises the following six steps of: 1) analyzing failure information of a failure mode of intermediate frequency log amplifier electronic products and component information of a product structure technology, and confirming a potential failure mechanism and a failure physical model thereof; 2) confirming an environmental stress influencing the failure mechanism; 3) correcting related parameters in the deduced failure physical model by performing an accelerated ageing test; 4) utilizing an environmental stress sensor to monitor and record the environmental stress in the life cycle of the products; 5) utilizing the confirmed failure physical model to calculate a forecasted time to failure, namely, TTF, under different stress levels, and respectively calculating the life expenditure of the products caused by different failure mechanisms under each stress level according to an expenditure definition; and 6) forecasting the remained life of the products under different failure mechanisms, analyzing the reliability of the intermediate frequency log amplifier and obtaining the failure rate and reliability.

Description

Technical field: [0001] The invention provides a method for predicting the life of an intermediate frequency logarithmic amplifier, in particular to a method for predicting the life of an intermediate frequency logarithmic amplifier based on failure physics, and belongs to the technical field of life prediction for electronic products. Background technique: [0002] At present, GJB / Z 299C (Chinese military standard - electronic equipment reliability prediction manual) and MIL-HDBK_217F (US military standard - electronic equipment reliability prediction) are mainly used in engineering practice to predict the failure rate of electronic products / equipment. This method based on standards or manuals is a probabilistic statistical method based on a large number of failure statistics (including field or laboratory statistics), and its correctness is increasingly questioned. At the same time, due to the complexity of the structure of electronic products and their development speed i...

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Problems solved by technology

At the same time, due to the complexity of the structure of electronic products and their development speed is much faster than the statistical speed of failure data, there is a problem that relevant data are not provided in standards or manuals to predict certain electronic products

In addition, standard- or manual-based methods can only predict failure rates, but cannot accurately predict the life of electronic products after experiencing life-environmental cycles including the environment

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