Fully-automatic visual inspection machine for wafer
A visual inspection machine, fully automatic technology, applied in the field of machinery, can solve the problems of high labor cost, unguaranteed quality, low efficiency, etc., to achieve the effect of improving accuracy and improving work efficiency
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[0021] The following are specific embodiments of the present invention and in conjunction with the accompanying drawings, further describe the technical solution of the present invention, but the present invention is not limited to these embodiments.
[0022] Such as figure 1 with figure 2 As shown, the automatic wafer visual inspection machine includes a frame 1, which is provided with a pick-up carousel 2, a detection carousel 3 and a receiving box 4, and the receiving box 4 includes at least two compartments, the two Compartments are used to hold good and bad wafers respectively. The disk body of the detection turntable 3 is transparent, and the disk body is transparent, so that light can pass through more, and the visibility of the wafer is improved. Between the rack 1 and the pick-up carousel 2, there is a feeding mechanism capable of transporting wafers to the pick-up turntable 2. The feeding mechanism includes a feeding cylinder 5 designed on the rack 1 and located o...
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