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Optical lens center thickness measuring system and method

A technology of center thickness and optical lens, applied in measuring devices, optical devices, instruments, etc., can solve the problems of surface damage, unusability, inaccuracy of optical components, etc., to ensure accuracy, good feasibility, and simple measurement. quick effect

Inactive Publication Date: 2012-05-02
BIAOQI ELECTRONICS TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

When measuring the thickness of the center of the lens, one is to find the highest or lowest point, which is very slow and inaccurate; the second is that the surface of the optical element is easily damaged, making it unusable

Method used

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  • Optical lens center thickness measuring system and method
  • Optical lens center thickness measuring system and method
  • Optical lens center thickness measuring system and method

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Embodiment Construction

[0032] refer to figure 1 , optical lens center thickness measurement system, including a light source, also includes a spectroscopic device, an optical probe, a spectrometer and a computer, the light source is connected to the spectroscopic device, the spectroscopic device and the optical probe are facing and centered on the same axis, one end of the spectroscopic device A spectrometer is also connected, and the spectrometer is connected to a computer.

[0033] As a further preferred implementation manner, an aspheric optical system is arranged inside the optical probe.

[0034] As a further preferred embodiment, it also includes a support frame for fixing the optical probe, an object stage and a fixture for fixing the measured part.

[0035] refer to figure 2 , optical lens center thickness measurement method, comprises the following steps:

[0036] A. The polychromatic light emitted by the light source enters the optical probe after being coupled by the spectroscopic dev...

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Abstract

The invention discloses an optical lens center thickness measuring system and method. The system comprises a light source, wherein the light source is connected with a light splitting device; the light splitting device is over against an optical probe, and the centers of the light splitting device and the optical probe are positioned on the same shaft; one end of the light splitting device is also connected with a spectrograph; and the spectrograph is connected to a computer. The method comprises the following steps: polychromatic light emitted by the light source enters the optical probe after being subjected to light ray coupling by the light splitting device; the polychromatic light passing through the optical probe is irradiated to a measured part for reflecting and refracting; the light which is reflected to the probe enters the spectrograph after passing through the light splitting device; the spectrograph obtains an energy curve graph of different wavelength light according to the energy analysis of returned light; and the obtained data is transmitted to a computer and calculated by a formula to obtain lens center thickness, and the lens center thickness is displayed. The optical lens center thickness measuring system and method have the advantages of simplicity, portability and precise data during measurement, the non-contact measuring method can not damage parts, and the optical lens center thickness measuring system and method are widely applied to the precise measurement of optical parts.

Description

technical field [0001] The invention relates to the technical field of optical precision measurement, in particular to a system and method for measuring the thickness of the center of an optical lens. Background technique [0002] In the field of optics, the measurement of lens center thickness is of great significance. The center thickness of the lens is an important parameter in the optical system. The quality of its processing determines the quality of optical imaging. Especially for lenses in high-performance optical systems such as lithography machine objective lenses and aerospace cameras, a slight deviation in the center thickness of the lens may lead to unclear imaging, so it is necessary to strictly control the accuracy of its measurement, and reduce it as much as possible. small error. [0003] The existing methods for measuring the thickness of the lens center are divided into two types: contact measurement and non-contact measurement. [0004] Contact measurem...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06
Inventor 宋光均吴剑峰郑祥利
Owner BIAOQI ELECTRONICS TECH
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