Socket for electrical parts

Abstract

A socket for an electrical part prevents a bad electrical connection with a circuit by preventing a deformation of a tip of a contact pin. When a tip of the other terminal is pressed to a substrate under a state that first and second holes of first and second holding plates are shifted each other, an upper terminal of the held portion of the other terminal contacts to a lower surface of the second holding plate, and makes the second holding plate to separate from the first holding plate against a spring force of a urging member. At this time, the portion projecting from the lower surface of the first holding plate toward the substrate moves into the first hole.

Description

technical field [0001] The present invention relates to a kind of electrical component socket used in burn-in test (burn-in test) etc. of IC package (electrical component), particularly relate to being used in LGA (Land Grid Array, land grid array / contact array package) ), BGA (Ball Grid Array, goal array / ball grid array package) type IC package socket for electrical components. Background technique [0002] Conventionally, jigs used in steps of eliminating initial defects of IC packages (burn-in tests, etc.) are known regarding electrical component sockets. [0003] Among sockets for electrical components, for sockets for electrical components used in burn-in tests of LGA-type and BGA-type IC packages, if the IC package is accommodated at a predetermined position on the socket body, a plurality of contact pin pairs can be used. The external electrical test circuit is electrically connected to a plurality of electrodes formed on the back surface of the IC package. [0004]...

AI Technical Summary

Problems solved by technology

[0009] However, if such a conventional electrical component socket 100 is to be used in a device in which the tip of the contact pin 101 is pressed against the current-carrying terminal on the substrate to conduct electricity between the contact pin 101 and an external electrical test circuit, the The top end of the contact pin 101 is deformed due to the tightening force when the socket main body (first to third support plates 103 to 105) are screwed to the substrate

Therefore, poor contact may occur between the contact pin 101 and the terminal on the substrate, thereby causing poor electrical conduction between the contact pin 101 and the external electrical test circuit.

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