Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Embedded device system deadlock debugging device and method

An embedded device and embedded system technology, applied in the direction of multi-program device, program startup/switching, etc., can solve problems such as low debugging efficiency, difficult debugging, lack of scientific technical means, etc., and achieve the effect of improving debugging efficiency

Inactive Publication Date: 2011-11-23
KONKA GROUP
View PDF0 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Obviously, this method of solving the deadlock of the embedded system lacks scientific technical means, not only the debugging efficiency is low, but also the operating environment of the system is destroyed, which brings more difficulties to the subsequent debugging

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Embedded device system deadlock debugging device and method
  • Embedded device system deadlock debugging device and method
  • Embedded device system deadlock debugging device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] Below, the technical solution of the present invention will be described in detail with reference to the accompanying drawings and preferred embodiments.

[0019] refer to figure 1 A system deadlock debugging device for an embedded device comprises: a sequentially connected system detection module 1 , an interrupt module 2 and a display module 3 . Among them, the system detection module 1 is used to detect the running state of the embedded system in real time, and output an interrupt command to the interrupt module. The interrupt module 2 is used to receive the instruction of the system detection module to interrupt the operation of the system, and read the parameter data in the CPU register of the embedded system. The display module 3 is used for receiving the instruction of the interrupt module to display the parameter data in the CPU memory of the embedded system.

[0020] The interrupt module 2 is an interrupt module with a button interrupt mode or a specific chip...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an embedded device system deadlock debugging device and method. an interrupt program is operated in an interrupt mode of generating key interrupt or chip level high interrupt after system deadlock occurs, an execution state of a system program is visually displayed by using an LCD screen in an interrupt processing program so that a user rapidly and effectively directly searches an obj or map target file when system software is compiled for positioning a fault according to parameter data of a CPU register. The invention has the advantages that firstly, the deadlock state of an embedded system is effectively positioned, debugging efficiency is greatly increased; and secondly, the original operation environment during the deadlock of the system is not changed, and the performance of the normally-operating program can not be influenced.

Description

technical field [0001] The invention relates to the field of embedded devices, in particular to a system deadlock debugging method for embedded devices. Background technique [0002] With the rapid development of science and technology, embedded system equipment has been widely used in various fields of society, such as military, consumer electronics, teaching, etc. The development and debugging of embedded systems has become an important content to improve people's living standards. [0003] Embedded system is a miniaturized computer system, which is based on hardware and uses software as a means to realize the application functions required by users. Embedded systems may cause deadlocks due to some unknown reasons. The traditional debugging method for deadlock is: to debug multiple times, and to add new debugging information according to the results of the last debugging information before each debugging, to adopt guessing methods, to repeatedly verify and check each susp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F9/48
Inventor 罗民
Owner KONKA GROUP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products