System and method for testing chip voltage signal

Abstract

The invention relates to a system and a method for testing a chip voltage signal. The system comprises a sampling resistance module, a test mode selection controlling register, a judgment threshold voltage selection controlling register, a to-be-detected voltage gate control register, a comparer module and a digital sampling and processing module, wherein the sampling resistance module is connected with an external power supply; different voltage signals of the chip are detected and compared by gating different judgment threshold voltages (i.e. reference voltage); and whether a chip to be detected conforms to the requirement is judged according to an output comparison result. Further, certain control logic modules are added in the system to trim the chip to be detected, so that the chip can conform to the requirement. With the scheme of the invention, the internal voltage signal (comprising a sensitive voltage signal) of the chip is detected on the premise of adding no test pads, thereby saving chip area. The invention is suitable for automatic testing, the problems that parts of current detection circuits are complex, time is consumed and cost is high can be creatively solved, and the method and the system are suitable for being popularized and used.

Description

technical field [0001] The invention relates to a chip voltage test system and a test method thereof, which can complete the detection of chip internal voltage signals (including sensitive voltage signals) without adding test pads (pads). Background technique [0002] At present, the development of smart cards or dual-interface cards is getting faster and faster, and the industry's requirements for card performance are getting higher and higher, while the market's requirements for its cost are getting lower and lower. The voltage inside the card is undoubtedly an important indicator reflecting the quality of the card. Due to the complex power structure of the dual-interface card, in order to ensure the reliability of the chip, there will be more voltage signals to be monitored during the final test of the general chip. The voltage signal test circuits currently used are relatively complex and require more test PADs (pads). [0003] For example, the common method is to test...

AI Technical Summary

Problems solved by technology

[0005] The present invention solves the problems of complex, time-consuming and high-cost part of the detection circuit for the voltage signal test in the final test of the existing smart card (dual-interface) chip or multi-power chip, and provides a chip voltage signal test system and its testing method

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