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Method for detecting micro space debris

A detection method and debris technology, applied in the field of space environment detection, can solve the problems of increasing the speed of changes in the distribution of space debris

Active Publication Date: 2011-05-04
NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

At the same time, due to recent events such as the destruction of satellites in orbit, the rate of change in the distribution of space debris has increased

Method used

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  • Method for detecting micro space debris

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Embodiment Construction

[0026] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0027] A detection method for micro-debris in space. The detection film is exposed in space to capture the micro-debris, and then the detection film is transported back to the ground, and the injection depth and chemical composition of the micro-debris are analyzed by physical analysis methods. According to the calculation of the impact depth formula, The injection depth can reflect the size of the incident debris; the specific steps are:

[0028] 1) Design and prepare the detection film:

[0029] The detection film includes the captured debris layer, the transition layer and the base material from top to bottom, such as figure 1 Shown; two detection films were prepared;

[0030] The material used for the captured debris layer is Au, with a thickness of 4 μm; the captured debris layer is the main component of the detection film, and its main function ...

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Abstract

The invention relates to a method for detecting micro space debris and belongs to the technical field of micro space debris. A detection thin film comprises a debris capturing layer material, a transitional layer material and a base material from top down, wherein the micro space debris layer material is 1to 4 micrometer-thick Au; the base material is 1 to 3-millimeter-thick quartz glass, and the transitional layer material is 50 to 100 nanometer-thick Ir; the detection thin film is carried by the windward side or leeside of spacecraft, and after being exposed in space, the detection thin film is brought back to the ground; ground analysis is performed by secondary ion mass spectroscopic analysis or X-ray photoelectron spectroscopic analysis under ion gun analysis to obtain the correspondence between the data after the analysis of the detection thin film and the related data of the space debris; and thus, the chemical composition of the captured debris is obtained. In the invention, a low-weight power-free detection thin film is used to realize the detection of the space micro debris, and the space debris that can be captured and analyzed by the debris capturing layer is of mg order.

Description

technical field [0001] The invention relates to a detection method for tiny space debris, belonging to the technical field of space environment detection. Background technique [0002] With the significant increase in the orbital time of our country's spacecraft, it is particularly important to monitor the distribution and speed of space debris in orbit, and to evaluate the impact of debris on spacecraft materials. At the same time, due to recent events such as the destruction of satellites in orbit, the speed of change in the distribution of space debris has increased. It also puts forward requirements for the development of space debris on-orbit detection films. [0003] Smaller parts of these debris are difficult to obtain through ground observations, and the detection of cosmic debris in the US Long-Term Exposure Facility (LDEF) is monitored through on-orbit detection films. The progress of my country's space station program provides an application background for the s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B21/18G01N27/62G01N23/22
Inventor 郭云杨生胜张剑锋
Owner NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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