Method for evaluating long life of component

Abstract

The invention discloses a method for evaluating long life of a component. The method comprises the following steps of: analyzing characteristics, an application platform and an application environment of the component; initially determining a stress level and sensitive parameters of a test; determining an application sequence of stress factors, responding to an analytical method for the sensitive parameters, and determining test equipment; performing an official test, namely recording sensitive parameter values of a component accelerated life test at certain time intervals to display changes of the sensitive parameters of the component accelerated life test along with time; performing graphical analysis by using graphic software, and selecting the best accelerator model and lifetime forecasting model; and verifying whether the models are valid, if so, evaluating the long life of the component, otherwise, redetermining the parameters. The method has the advantages of short test period, low testing expenses, general applicability, scientificity, no need of a preset model, suitability for small increments and capability of evaluating the long life of components adopting new technology and having long life.

Description

[0001] Cross References to Related Applications [0002] This application claims the priority of the Chinese patent application with application number 2009100895788 filed on July 24, 2009. technical field [0003] The invention relates to a method for evaluating the long life of components. Background technique [0004] With the development of science and technology, the long service life of many electronic products today puts forward higher requirements for the storage life and service life of components. For example, some products require a working life of more than 20 years. Therefore, how to effectively evaluate the life of components is a problem that needs to be solved. [0005] In the past, the life evaluation method used the traditional accelerated life test method, that is, the stress accelerated test method was used for life evaluation. It generally adopts temperature stress accelerated test, and its process is: ask questions, obtain data, put the data into a fi...

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Problems solved by technology

[0006] There are certain risks in the traditional method. Based on the past data analysis experience, the model must be applied to the obtained data a priori, and the analysis is performed on this model, so there is a risk of model application.

Moreover, at present, there are no long-life evaluation methods and standards other than integrated circuits.

Integrated circuits are also evaluated by the traditional accelerated test method, but the test period is long, the test cost is expensive, and the empirical model is used for evaluation. The scientificity and effectiveness of the evaluation results need to be verified

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