Process detection method and device

A technology of process detection and process capability index, applied in the direction of electrical program control, comprehensive factory control, comprehensive factory control, etc., can solve problems such as inaccurate status, and achieve the effect of accurate analysis

Inactive Publication Date: 2011-01-05
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Abstract
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Problems solved by technology

[0025] The present invention solves the problem that when the specification target value deviates from the center of the specification lower limit value and the specification upper limit value, the application of the existing process capability index to analyze the state of the process will be inaccurate

Method used

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  • Process detection method and device
  • Process detection method and device

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Embodiment Construction

[0041] According to the relationship between the average value of the quality characteristic value of the product and the specification target value, the embodiment of the present invention sets the offset coefficient of the process capability index respectively, so as to obtain the process capability index that can accurately reflect the state of the process.

[0042] figure 1 It is a flow chart of the process detection method of the embodiment of the present invention, comprising the following steps:

[0043] Step S11, acquiring the quality characteristic value of the product.

[0044] Step S12, calculating the average value and standard deviation of the quality characteristic values ​​of the product.

[0045] Step S13, setting the offset coefficient, wherein, if the calculated average value of the quality characteristic value of the product is less than the specification target value, the offset coefficient is associated with the lower limit value of the specification, and...

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Abstract

The invention provides process detection method and device. The method comprises the steps of: obtaining the quality characteristic values of a product; computing the average value and standard deviation of the quality characteristic values of the product; setting an offset coefficient, wherein if the computed average value of the quality characteristic values of the product is less than a specification target value, the offset coefficient is associated with a specification lower limit, or else, the offset coefficient is associated with a specification upper limit; computing a process capability index which is associated with the specification upper limit, the specification lower limit, the offset coefficient and the standard deviation of the quality characteristic values of the product; and analyzing the technical capability of the process according to the process capability index. The process detection method and device can correctly analyze the state of the process and correct the difference or abnormal phenomenon in the process by adopting corresponding measures, so as to make the work procedure in a control (stable) state.

Description

technical field [0001] The invention relates to the field of quality control, in particular to a process detection method and device. Background technique [0002] Quality management is mainly to find out the rules of fluctuations by collecting and organizing data, control normal fluctuations to a minimum, and eliminate abnormal fluctuations caused by systemic reasons. The process of comparing the actual measured quality characteristics with the relevant standards, and taking corresponding measures to correct the differences or abnormal phenomena, so that the process is in a state of control, is called quality control. The process referred to here refers to the process of the comprehensive action of five basic quality factors such as operator, machine, raw material, process method and production environment, that is, the production process of product quality. Product quality is the comprehensive performance of the various quality factors in the process. [0003] Process ca...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/418
CPCY02P90/02
Inventor 王邕保
Owner SEMICON MFG INT (SHANGHAI) CORP
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