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Thermal contact resistance test equipment with compensating heating device

A technology of contact thermal resistance and compensation heating, which is applied in the field of testing, can solve problems such as large errors, impractical engineering, and many parameters, and achieve the effects of avoiding errors, improving work efficiency, and avoiding loss of lateral heat flow

Inactive Publication Date: 2010-12-15
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these methods have many parameters and large errors, which are not practical in engineering

Method used

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  • Thermal contact resistance test equipment with compensating heating device
  • Thermal contact resistance test equipment with compensating heating device
  • Thermal contact resistance test equipment with compensating heating device

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Embodiment Construction

[0023] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0024] The invention provides a method for testing thermal contact resistance. The testing method utilizes the characteristics of temperature change of heat flow transmitted between different material interfaces to detect thermal contact resistance of the interface. Therefore, this method is relatively simple, reliable, and has high measurement accuracy and is easy to use. Operational test equipment will do. However, due to the need for sufficient heat exchange between the temperature measuring element and the surrounding medium, it takes a certain amount of time to achieve thermal equilibrium, so the data after reaching a steady state is credible. Based on the above factors, the contact thermal resistance testing method provided by the present invention is specifically realized through the following steps:

[0025] The first step is the preparation ...

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Abstract

The invention discloses a thermal contact resistance test equipment with a compensating heating device, mainly comprising a support frame, a top plate, a bottom plate, a stress loading device, a cooling device, a data acquisition system, a heating device and a temperature compensating device, wherein the compensating heating device comprises a thermoelectric couple and an annular heater, wherein the thermoelectric couple is arranged on the annular heater; the annular heater is arranged on the radial surface positioned on a contact interface of every two samples; the thermoelectric couple is connected with a temperature controller; and the temperature controller controls the on-off of the annular heater through temperature data fed back by the thermoelectric couple. The invention can control the heating temperature of the annular heater to be within a theoretical conducting temperature by regulating a temperature control point of the temperature controller so as to maximize the axial transmission of thermal flows on the contact interface of the samples, thereby preventing the horizontal thermal flows from dissipating and realizing the axial one-dimensional transfer of the thermal flows.

Description

technical field [0001] The invention belongs to the technical field of testing, and specifically relates to a method and equipment for testing thermal contact resistance, which is suitable for testing thermal contact resistance in different temperature and loading stress ranges, and especially capable of testing thermal contact resistance under high temperature and high contact stress conditions condition. Background technique [0002] When the surfaces of two objects come into contact with each other, no matter how smooth the surfaces are, there are always microscopic incomplete contact points. The contact surface of an object is composed of scattered small contact points, which are separated by large gaps, which may be vacuum or filled with heat transfer medium. Therefore, in addition to the inherent thermal resistance at the contact surface, there is an additional heat transfer resistance - contact thermal resistance. Contact resistance is an important parameter in many...

Claims

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Application Information

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IPC IPC(8): G01N25/20
Inventor 侯卫国张卫方王宗仁崔本仓唐庆云刘肖丁美丽王晓亮姚婧
Owner BEIHANG UNIV
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