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Device and method for testing infrared focal plane array device

A technology of infrared focal plane and focal plane array, applied in the field of infrared detection

Inactive Publication Date: 2010-09-08
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0006] (2) Invalid pixels, including dead pixels and overheated pixels

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  • Device and method for testing infrared focal plane array device
  • Device and method for testing infrared focal plane array device
  • Device and method for testing infrared focal plane array device

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Experimental program
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Embodiment Construction

[0130] The present invention will be further described below in conjunction with accompanying drawing:

[0131] The purpose of the present invention is to provide a general, analytical calculation method, hardware device and software program for testing infrared focal plane array device characteristic parameters that can be directly applied to hardware, so as to conveniently, quickly and accurately test the infrared focal plane array device performance parameters.

[0132] Such as figure 1As shown, in order to achieve the above object, the present invention provides a kind of general, the analytical calculation method of the test infrared focal plane array device characteristic parameter that can be directly applied to hardware, it is characterized in that, comprises the following steps:

[0133] Collect focal plane array raw data (a total of F frames);

[0134] Convert raw data into analog voltage values;

[0135] Average the voltage values ​​of the F frame to obtain the a...

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Abstract

The invention discloses a device for testing an infrared focal plane array device, which comprises a radiation source and focal plane array module, a drive control module and a data acquisition processing module, wherein the radiation source and focal plane array module comprises an infrared radiation source, an optical system and a tested infrared focal plane array; the drive control module comprises a bias control module, a temperature control module and a time sequence control module; and the data acquisition processing module comprises an analog-to-digital signal converter, a video output module, a data acquisition card and a data analysis processing module. The device of the invention has the characteristics of low cost, high efficiency, accuracy, reliability and the like, is suitable for testing the large-scale infrared focal plane array device, and is of very important instructive significance to the designer of the device and the designer of an imaging system.

Description

technical field [0001] The invention relates to the technical field of infrared detection, in particular to a novel general-purpose infrared focal plane array device testing device and a testing method thereof. Background technique [0002] Infrared imaging is the product of the comprehensive development of multi-disciplinary and multi-field technologies. Its key technologies include: infrared sensitive materials, semiconductor device technology, integrated circuit design, packaging technology, testing technology and vacuum technology. In recent years, with the rapid development of various technologies, infrared imaging technology has also developed rapidly, and has been widely used in civilian and military applications. The infrared focal plane array (IRFPA) is the core device of the staring infrared thermal imaging system, and its performance is directly related to the performance evaluation of the infrared thermal imager and the optimization of the image processing algori...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02G01J5/00
Inventor 刘子骥蒋亚东王涛阙旻祝红彬
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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